Advanced search
Publication Cover
Ferroelectrics Volume 541, 2019 - Issue 1: Proceedings of SPM-2018 and IWMN-2018, Part I of II
Submit an article Journal homepage
51
Views
3
CrossRef citations to date
0
Altmetric
Articles

Scanning capacitance microscopy of TGS − TGS + Cr ferroelectric crystals

R. V. GainutdinovShubnikov Institute of Crystallography of Federal Scientific Research Center “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, Russia; Correspondence[email protected]
View further author information
,
N. V. BeluginaShubnikov Institute of Crystallography of Federal Scientific Research Center “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, Russia; View further author information
,
A. K. LashkovaShubnikov Institute of Crystallography of Federal Scientific Research Center “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, Russia; View further author information
,
V. N. ShutInstitute of Technical Acoustic, The National Academy of Sciences of Belarus, Vitebsk, Belarus; View further author information
,
I. F. KashevichVitebsk State University, Department of Mathematics and IT, Vitebsk, BelarusView further author information
,
S. E. MozzharovInstitute of Technical Acoustic, The National Academy of Sciences of Belarus, Vitebsk, Belarus; View further author information
&
A. L. TolstikhinaShubnikov Institute of Crystallography of Federal Scientific Research Center “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, Russia; View further author information
 show all
Pages 39-46 | Received 29 Aug 2018, Accepted 26 Nov 2018, Published online: 09 Jul 2019

References

  • C. C. Williams, J. Slinkman, W. P. Hough, and H. K. Wickramasinghe, Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy, Appl. Phys. Lett. 55(16), 1662 (1989). DOI: 10.1063/1.102312.
  • Š. Lányi, Application of scanning capacitance microscopy to analysis at the nanoscale, in Applied scanning probe methods VIII: Scanning probe microscopy techniques (NanoScience and Technology) edited by B. Bhushan, H. Fuchs, M. Tomitori (Springer, Berlin, 2008), pp. 377.
  • R. A. Oliver, Advances in AFM for the electrical characterization of semiconductors, Rep. Prog. Phys. 71(7), 076501 (2008). DOI: 10.1088/0034-4885/71/7/076501.
  • K. L. Sorokina, and A. L. Tolstikhina, Atomic force microscopy modified for studying electric properties of thin films and crystals. Review, Crystallogr. Rep. 49(3), 476 (2004). DOI: 10.1134/1.1756648.
  • D. T. Lee, J. P. Pelz, and B. Bhushan, Scanning capacitance microscopy for thin film measurements, Nanotechnology. 17(5), 1484 (2006). DOI: 10.1088/0957-4484/17/5/054.
  • L. Fumagalli, G. Ferrari, M. Sampietro, and G. Gomila, Dielectric-constant measurement of thin insulating films at low frequency by nanoscale capacitance microscopy, Appl. Phys. Lett. 91(24), 243110 (2007). DOI: 10.1063/1.2821119.
  • L. Fumagalli, I. Casuso, G. Ferrari, and G. Gomila, Nanoscale capacitance microscopy of thin dielectric films, J. Appl. Phys. 104, 024315 (2008). DOI: 10.1063/1.2957069.
  • L. Fumagalli et al., Nanoscale capacitance imaging with attofarad resolution using ac current sensing atomic force microscopy, Nanotechnology. 17(18), 4581 (2006)., DOI: 10.1088/0957-4484/17/18/009.
  • Y. Naitou, and H. Ogiso, Scanning capacitance microscopy evaluation of lead zirconate titanate film formed by aerosol deposition method, Jpn. J. Appl. Phys. 45(3B), 1922 (2006). DOI: 10.1143/JJAP.45.1922.
  • C.-C. Leu et al., Contrast mechanism of ferroelectric domains in scanning capacitance microscopy, Electrochem. Solid-State Lett. 7(10), A327 (2004)., DOI: 10.1149/1.1789811.
  • M. S. Tsedrik, Physical properties of the crystals of the triglycine sulfate family (Nauka Tekhnika, Minsk, 1986) [in Russian]. DOI: 10.1086/ahr/94.3.819-a.
  • R. B. Lal, and A. K. Batra, Growth and properties of triglycine sulfate (TGS) crystal: Review, Ferroelectrics. 142(1), 51 (1993). DOI: 10.1080/00150199308237884.
  • N. V. Belugina et al., Nanorelief of the natural cleavage surface of triglycine sulphate crystals with substitutional and interstitial impurities, Crystallogr. Rep. 56(6), 1070 (2011). DOI: 10.1134/S1063774511030047.
  • V. N. Shut, I. F. Kashevich, and B. E. Watts, Water-soluble ferroelectric crystals with inhomogeneous impurity distribution, Crystallogr. Rep. 49(2), 206 (2004). DOI: 10.1134/1.1690417.
  • V. N. Shut, I. F. Kashevich, S. R. Syrtsov, and I. V. Shnaídshteín, Ferroelectric triglycine sulfate crystals with a profile distribution of chromium impurity, Crystallogr. Rep. 55(3), 458 (2010). DOI: 10.1134/S1063774510030156.
  • N. V. Belugina et al., Formation of a regular domain structure in TGS–TGS + Cr crystals with a profile impurity distribution, Crystallogr. Rep. 60(4), 555 (2015). DOI: 10.1134/S1063774515040082.
  • S. Magonov, and J. Alexander, Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials, Beilstein J. Nanotechnol. 2, 15 (2011). DOI: 10.3762/bjnano.2.2.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Order Reprints Request Corporate Permissions

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

Request Academic Permissions

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.

Related research

People also read lists articles that other readers of this article have read.

Recommended articles lists articles that we recommend and is powered by our AI driven recommendation engine.

Cited by lists all citing articles based on Crossref citations.
Articles with the Crossref icon will open in a new tab.