Design and simulation of high-performance lateral bipolar junction transistor on partial buried oxide

ABSTRACT

In this work, we propose a new structure of a lateral bipolar junction transistor (LAT-BJT) on partial buried oxide (PBOX). The novelty of the proposed LAT-BJT device is the use of PBOX, covering just base and emitter regions only. A two-dimensional (2D) calibrated simulation study of the proposed LAT-BJT device has shown that the proposed LAT-BJT on PBOX’s performance is unique when the PBOX is just covering base and emitter regions. At this length of PBOX, a sharp enhancement in cut-off frequency (f_T) (~10 times higher) is achieved in the proposed LAT-BJT on PBOX in comparison to an LAT-BJT on silicon-on-insulator (SOI). The breakdown voltage of the proposed LAT-BJT on PBOX is double than that of the LAT-BJT on SOI device at this PBOX length. A notable enhancement in current gain (β) is observed in the proposed LAT-BJT on PBOX in comparison to the LAT-BJT on bulk device. To check the performance of the proposed LAT-BJT on PBOX at the circuit level, two inverters have been designed and simulated using the mixed-mode simulations of Atlas simulator. It has been observed that the proposed LAT-BJT on PBOX significantly outperforms the conventional LAT-BJT device in switching performance. A notable improvement of 32% in ON delay and 72.9% in OFF delay is obtained in the proposed LAT-BJT on PBOX device in comparison to the conventional LAT-BJT device.

KEYWORDS:

• CAD
• semiconductors
• integrated circuits
• analogue circuits
• circuit synthesis

Acknowledgement

The authors would like to acknowledge the support from VPP program of King Saud University.

Disclosure statement

No potential conflict of interest was reported by the authors.

Additional information

Funding

The authors would like to acknowledge the financial support from NPST, Saudi Arabia, through the project No: 11-NAN-2018-02.