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Spectroscopy Letters
An International Journal for Rapid Communication
Volume 41, 2008 - Issue 6: Special Issue on RISO 2007, “The International Meeting on Spectroscopy and Optics”
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Original Articles

Influence of Roughness Surfaces on Third-Order Nonlinear-Optical Properties of Erbium-Doped Zinc Oxide Thin Films

M. Alaoui Lamrani Laboratoire Optoélectronique et Physico-chimie des Matériaux Université Ibn Tofail, Faculté des Sciences, Kenitra, Marocco
,
M. El Jouad Laboratoire Optoélectronique et Physico-chimie des Matériaux Université Ibn Tofail, Faculté des Sciences, Kenitra, Marocco
,
M. Addou Laboratoire Optoélectronique et Physico-chimie des Matériaux Université Ibn Tofail, Faculté des Sciences, Kenitra, MaroccoCorrespondence[email protected]
,
T. El Habbani Laboratoire Optoélectronique et Physico-chimie des Matériaux Université Ibn Tofail, Faculté des Sciences, Kenitra, Marocco
,
N. Fellahi Laboratoire Optoélectronique et Physico-chimie des Matériaux Université Ibn Tofail, Faculté des Sciences, Kenitra, Marocco
,
K. Bahedi Laboratoire Optoélectronique et Physico-chimie des Matériaux Université Ibn Tofail, Faculté des Sciences, Kenitra, Marocco
,
M. Ebn Touhami Laboratoire Optoélectronique et Physico-chimie des Matériaux Université Ibn Tofail, Faculté des Sciences, Kenitra, Marocco
,
Z. Essaïdi Laboratoire POMA, UMR CNRS 6136, Université d'Angers, France
,
Z. Sofiani Laboratoire POMA, UMR CNRS 6136, Université d'Angers, France
,
B. Sahraoui Laboratoire POMA, UMR CNRS 6136, Université d'Angers, France
,
A. Meghea Faculty of Applied Chemistry and Material Science, University Politechnica of Bucharest, Bucharest, Romania
&
I. Rau Faculty of Applied Chemistry and Material Science, University Politechnica of Bucharest, Bucharest, Romania
 show all
Pages 292-298 | Received 02 Jul 2007, Published online: 22 Jun 2010
 
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ABSTRACT

Zinc oxide (ZnO) and erbium-doped zinc oxide (ZnO:Er) thin films were deposited on heated glass substrates using the spray pyrolysis technique. Third-order nonlinear-optical properties of the thin films have been investigated using the third harmonic generation (THG) at wavelength of 1064 nm in picosecond regime. The dependence of third-order nonlinear susceptibility and transmission characteristics on the thin films roughness has been evaluated. Third-order nonlinear optical susceptibility (χ(3)) values of the studied materials were in the remarkable range of 10−2 esu. The morphologic properties of the deposited films have been analyzed using x-ray diffraction (XRD) and atomic force microscopy (AFM) and the luminescence properties by cathodoluminescence (CL). A correlation between optical properties and structural properties is given.

ACKNOWLEDGMENT

This work is supported by project PROTARS III (D12/09).

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