Abstract
Cumulative count of conforming control chart is usually used to monitor fraction nonconforming in high-yield processes. In this article, we propose m-of-m control chart based on cumulative count of conforming units for high-yield processes. The steady-state properties of the m-of-m control chart are investigated. We compare performance of the m-of-m control chart with control chart based on cumulative count of conforming units. We present Markov chain model of the m-of-m control chart to evaluate average run length, standard deviation of run length and quartiles.
Mathematics Subject Classification:
Acknowledgment
The authors would like to thank a referee for valuable comments which significantly improved this article.