The Steady-State Performance of Cumulative Count of a Conforming Control Chart Based On Runs Rules

References

• Albers W. (2010). The optimal choice of negative binomial charts for monitoring high-quality processes. J. Statist. Plann. Infer. 140(1):214–225.
   Web of Science ®Google Scholar
• Brooke D., Evans, D.A. (1972). An approach to probability distribution of CUSUM run length. Biometrika 59(3): 539–549.
   Web of Science ®Google Scholar
• Calvin, T.W. (1983). Quality control techniques for zero defects. IEEE Trans. Compon. Hybrids Manufact. Technol. 6:323–328.
   Web of Science ®Google Scholar
• Champ, C.W., Woodall, W.H. (1987). Exact results for Shewhart control chart with supplementary runs rules. Technometrics 29(4):393–399.
   Web of Science ®Google Scholar
• Chang, T.C., Gan, F.F. (2007). Modified Shewhart charts for high yield processes. J. Appl. Statist. 34(7):857–877.
   Web of Science ®Google Scholar
• Chen, L.Y. , Xie, M., Goh, T.N. (1997). Two-stage control charts for high yield processes. Int. J. Reliab. Qual. Safety Eng. 4(2):149–165.
   Google Scholar
• Chen, P.W., Cheng, C.S. (2010). An ARL-unbiased approach to setting control limits of CCC-r chart for high-yield processes. J. Qual. 17(6):435–451.
   Google Scholar
• Chen, P.W., Cheng, C.S. (2011). On statistical design of the cumulative qauantity control chart for monitoring high-yield process. Commun. Statist. Theor. Meth. 40(11):1911–1928.
   Web of Science ®Google Scholar
• Chen, Y.K., Chen, C.Y., Chiou, K.C. (2010). Cumulative conformance count chart with variable sampling interval and control limits. Appl. Stochastic Mod. Busi. Indust. 27:410
   Web of Science ®Google Scholar
• Cheng, C.W., Chen, P.W. (2008). The design of cumulative count of conforming chart with supplementary runs rules. 9th Asia Pacific Industrial Engineering and Management Systems Conference, pp. 204–209.
   Google Scholar
• Crosier, R.B. (1986). A new two-sided cumulative sum quality control scheme. Technometrics 28(3):187–194.
   Web of Science ®Google Scholar
• Goh, T.N. (1987). A control charts for very high yield processes. Qual. Assur. 13(1):18–22.
   Google Scholar
• Kaminsky, F.C., Benneyan, J.C., Davis, R.D., Burke, R.J. (1992). Statistical control charts based on geometric distribution. J. Qual. Technol. 4(2):63–69.
   Web of Science ®Google Scholar
• Kuralmani, V., Xie, M., Goh, T.N., Gan, F.F. (2002). A conditional decision procedure for high yield processes. IIE Trans. 34(12):1021–1030.
   Web of Science ®Google Scholar
• Lai, C.D., Govindaraju, K. (2008). Reduction of control-chart signal variability for high-quality processes. J. Appl. Statist. 35(6):671–679.
   Web of Science ®Google Scholar
• Lucas, J.M. (1989). Control schemes for low count levels. J. Qual. Technol. 21(3):199–201.
   Web of Science ®Google Scholar
• Nelson, L.W. (1994). A control charts for parts-per million nonconforming items. J. Qual. Technol. 26(3):239–240.
   Web of Science ®Google Scholar
• Noorossana, R., Saghaei, A., Paynabar K., Abdi, S. (2009). Identifying the period of a step change in high-yield processes. Qual. Reliab. Eng. Int. 25(7):875–883.
   Web of Science ®Google Scholar
• Steiner, S.H., MacKay R.J. (2004). Effective monitoring of processes with parts per million defective. In: Lenz, H.J., Wilrich, P.T., Eds., Frontiers in Statistical Quality Control 7. Heidelberg, Germany: Physica-Verlag, pp. 140–149.
   Google Scholar
• Szarkar III, J.L., Woodall, W.H. (2011). A review and perspective on surveillance of bernoulli processes. Quali. Reliab. Eng. Int. 27:735–752.
   Web of Science ®Google Scholar
• Wang, H. (2009). Comparison of p control charts for low defective rate. Computati. Statist. Data Anal. 53(12):4210–4220.
   Web of Science ®Google Scholar
• Xie, M., Goh, T.N. (1992). Some procedures for decision making in controlling high yield processes. Qual. Reliab. Eng. Int. 8:355–360.
   Google Scholar
• Xie, M., Goh, T.N. (1993). Improvement detection by control charts for high yield processes. Int. J. Qual. Reliab. Manage. 10(7):24–31.
   Google Scholar
• Xie, M., Lu, X.S., Goh, T.N., Chan, L.Y. (1999). A quality monitoring and decision making scheme for automated production processes. Int. J. Qual. Reliab. Manage. 16(2):148–157.
   Google Scholar
• Xie, M., Goh, T.N., Kuralmani, V. (2000). On optimal setting of control limits for geometric chart. Int. J. Reliab. Qual. Safety Eng. 7(1):17–25.
   Google Scholar
• Xie, M., Goh, T.N. (2003). Statistical control of a six sigma process. Qual. Eng. 15(4):587–592.
   Google Scholar
• Xie, W., Xie, M., Goh, T.N. (1995). A Shewhart-like charting technique for high yield process. Qual. Reliab. Eng. Int. 11:189–196.
   Web of Science ®Google Scholar
• Zhang, C.W., Xie, M., Jin, T. (2012). An improved self-starting cumulative count of conforming chart for monitoring high-quality process under group inspection. Int. J. Product. Res. 50(23):7026–7043.
   Web of Science ®Google Scholar
• Zhang, C.W., Xie, M., Goh, T.N. (2010). On cumulative conforming type of control charts for high-quality processes under sampling inspection. Econ. Qual. Control 20(2):205–22.
   Google Scholar