Abstract
The latest developments in single-crystal X-ray diffraction at high pressure and high temperature are described. Advances in diamond anvil cell designs and X-ray sources allow collecting single-crystal diffraction data at pressures up and above 100 GPa and at temperatures above 1000°C. The technical details of single-crystal X-ray diffraction at high pressure such as the choice of pressure-transmitting media or the different methods for measuring pressures and temperatures have been reviewed. Examples of structural solution of complex structures and new materials, structural refinements of high pressure polymorphs as well as accurate compressibility data are described in order to outline the several advantages of using single crystals instead of powdered samples in high pressure diffraction experiments.
Acknowledgements
Support has been provided by ERC advanced Grant no. 227893 “DEEP” funded through the EU 7th Framework Programme.