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Integrated Ferroelectrics
An International Journal
Volume 15, 1997 - Issue 1-4
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Original Articles

Imprint induced failure modes in ferroelectric non-volatile memories

J. M. Benedetto Army Research Laboratory Adelphi, MD, 20783
Pages 29-38 | Received 18 Mar 1996, Published online: 19 Aug 2006

References

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  • Auciello , O. , Gifford , K. D. , Lichtenwalner , D. J. , Dat , R. , Al-Shareef , H. N. , Bellur , K. R. and Kingon , A. I. 1995 . A Review of Composition-Structure-Property Relationships for PZT-Based Heterostructure Capacitors . Integrated Ferrelectrics , 6 : 173
  • Ramesh , R. , Gilchrist , H. , Sands , T. , Keramidas , V. G. , Haakenaasen , R. and Fork , D. K. 1993 . Ferroelectric La-Sr-Co-O/Pb-Zr-Ti-O/ La-Sr-Co-O Heterostructures on Silicon Via Template Growth . Appl. Phys. Lett. , 63 : 3592
  • Moore , R. A. and Benedetto , J. M. 1995 . Ionizing Radiation Effects on the Retention Characteristics of Ferroelectric Thin-Films . IEEE Trans. Nucl. Sci. , NS-42 : 1575 – 1584 .
  • Benedetto , J. M. , Roush , M. L. , Lloyd , I. K. , Ramesh , R. and Rychlik , B. 1995 . The Temperature Dependence of Ferroelectric Imprint . Integrated Ferroelectrics , 10 : 279 – 288 .
  • Benedetto , J. M. , Roush , M. L. , Lloyd , I. K. and Ramesh , R. 1994 . Imprint of Ferroelectric PLZT Thin-Film Capacitors with Lanthanum Strontium Cobalt Oxide Electrodes . Proc. of the Ninth IEEE ISAF , : 66 – 69 .
  • Lee , J. J. , Thio , C. L. and Desu , S. B. 1995 . Retention and Imprint Properties of Ferroelectric Thin Films . Phys. Stat. Sol. , 151 : 171 – 182 .
  • Evans , J. T. Jr. and Cardoza , H. E. 1995 . The Imprint Mechanism in Ferroelectric Capacitors . Integrated Ferroelectrics , 10 : 267 – 277 .
  • Nakamura , T. , Nakao , Y. , Kamisawa , A. and Takasu , H. 1995 . Electrical Properties of PZT Thin Films for Memory Applications . Integrated Ferroelectrics , 11 : 161 – 170 .
  • Warren , W. L. , Dimos , D. , Pike , G. E. , Tuttle , B. A. , Raymond , M. V. , Ramesh , R. and Evans , J. T. Jr. 1995 . Voltage Shifts and Imprint in Ferroelectric Capacitors . Appl. Phys. Lett. , 67 ( 6 ) : 866 – 868 .
  • Benedetto , J. M. 1995 . “ Reliability Implications of Imprint in Ferroelectric Non-Volatile Memories ” . University of Maryland . Ph.D., Dissertation

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