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Abstract
Modern electronic circuits are important to communication, traffic systems, and security systems. An intentional threat to these systems could result in casualties and economic disaster. This study examined the damage effects to a microcontroller device with coupling caused by an ultra-wideband high power electromagnetic (UWB-HPEM) pulse. The UWB measurements were performed in an semi-anechoic chamber using a RADAN UWB voltage source which can generate a transient impulse of about 180 kV. The susceptibility level for the microcontroller was assessed by field strength, and its failure modes were observed. In the A-type of malfunction, the device has returned to its normal state by external rest at lower field strengths (8.9 kV/m). In the B-type of malfunction, the device recovered from its normal state by switching on/off a power supply when the amplitude of the electromagnetic pulse increased twofold. A further increase in amplitude leads to destruction. Also, the coupled waveform was analogous to damped sinusoidal functions. Based on these results, the susceptibility of the microcontroller can be applied to a database to help elucidate the effects of microwaves on electronic equipment.