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Journal of Electromagnetic Waves and Applications Volume 24, 2010 - Issue 8-9
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Articles

Susceptibility and Coupled Waveform of Microcontroller Device by Impact of UWB-HPEM

S. M. Hwang Department of Electrical Engineering, INHA University, 253 Yonghyun-Dong, Nam Incheon 402-751, Korea
,
J. I. Hong Department of Electrical Engineering, INHA University, 253 Yonghyun-Dong, Nam Incheon 402-751, Korea
,
S.-M. Han Department of Electrical Engineering, INHA University, 253 Yonghyun-Dong, Nam Incheon 402-751, Korea
,
C. S. Huh Department of Electrical Engineering, INHA University, 253 Yonghyun-Dong, Nam Incheon 402-751, Korea
&
J.-S. Choi Agency for Defense Development, Yuseong, P. O. Box 35-42, Daejeon 305-600, Korea
Pages 1059-1067 | Published online: 03 Apr 2012

References

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  • Hong , J. I. , Hwang , S. M. and Huh , C. S. 2008 . Susceptibility of microcontroller devices due to coupling effects under narrowband high power electromagnetic waves by magnetron . Journal of Electromagnetic Waves and Applications , 22 ( No. 17–18 ) : 2451 – 2462 .
  • Mohammadi , F. A. and Yagoub , M. C. E. 2008 . Electromagnetic model for microwave components of integrated circuits . Progress In Electromagnetics Research B , 1 : 81 – 94 .
  • Nitsch , D. , Camp , M. , Sabath , F. , Haseborg , J. L. and Garbe , H. 2004 . Susceptibility of some electronic equipment to HPEM threats . IEEE Trans. Electromagn. Compat. , 46 ( No. 3 ) Aug. : 380 – 389 .
  • Bäckström , M. G. 2004 . Susceptibility of electronic systems to high power microwaves: Summary of test experience . IEEE Transactions on Electromagnetic Compatibility , 46 ( No. 3 )
  • Hwang , S.-M. , Hong , J.-I. and Huh , C.-S. 2008 . Characterization of the susceptibility of integrated circuits with induction caused by high power microwaves . Progress In Electromagnetics Research , PIER 81 : 61 – 72 .
  • Wang , H. , Li , J. , Li , H. , Xiao , K. and Chen , H. 2008 . Experimental study and spice simulation of CMOS inverters latch-up effects due to high power microwave interference . Progress In Electromagnetics Research , PIER 87 : 313 – 330 .
  • Kim , K. 2007 . Critical upsets of CMOS inverters in static operation due to high-power microwave interference . IEEE Trans. on EMC , 49 ( No. 4 ) : 876 – 885 .
  • Camp , M. , Garbe , H. and Nitsch , D. 2002 . Influence of the technology on the destruction effects of semiconductors by impact of EMP and UWB pulses . IEEE Trans. on EMC , 1 : 87 – 92 .
  • “ JESD78 latch-up testing standard ” . In Electronic Industry Association JEDEC standards Arlington , VA
  • Tesche , F. M. , Ianoz , M. V. and Karlsson , T. 1996 . EMC Analysis Methods and Computational Models , John wiley & Sons Inc .

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