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Analytical Letters Volume 52, 2019 - Issue 1: PIM special issue
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Sensors

Simultaneously Mapping of In-Depth Thermal Diffusivity and Effective Infrared Absorption Coefficient of Silicon-Doped Gallium Arsenide Wafer Using Lock-in Thermography

M. PawlakInstitute of Physics, Nicolaus Copernicus University, Torun, PolandCorrespondence[email protected]
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K. RamzaInstitute of Physics, Nicolaus Copernicus University, Torun, PolandView further author information
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M. StrezaDepartment of Molecular and Biomolecular Physics, National Institute for R&D of Isotopic and Molecular Technologies, Cluj Napoca, RomaniaView further author information
Pages 93-101 | Received 12 Oct 2017, Accepted 13 Nov 2017, Published online: 16 Jan 2018

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