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Philosophical Magazine A Volume 82, 2002 - Issue 10
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Original Articles

Development and application of a combined atomic force microscopy-nanoindentation system with a silicon tip and a diamond indenter

K. Miyahara National Institute for Materials Science, Materials Engineering Laboratory , 2-1-2, Sengen, Tsukuba-shi, Ibaraki, 305-0047, Japan
,
N. Nagashima National Institute for Materials Science, Materials Engineering Laboratory , 2-1-2, Sengen, Tsukuba-shi, Ibaraki, 305-0047, Japan
&
S. Matsuoka National Institute for Materials Science, Materials Engineering Laboratory , 2-1-2, Sengen, Tsukuba-shi, Ibaraki, 305-0047, Japan
Pages 2149-2160 | Received 16 Jul 2001, Accepted 01 Mar 2002, Published online: 04 Aug 2009

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