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Philosophical Magazine A Volume 65, 1992 - Issue 5
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Original Articles

A new study of critical layer thickness, stability and strain relaxation in pseudomorphic gexsi1-x strained epilayers

Suresh C. Jain Clarendon Laboratory, Oxford, OX1 3PU, U.K.; Solid State Physics Laboratory, Delhi, India
,
T. J. Gosling A.E.A. Technology, Harwell Laboratory, Oxon, OX 11 0RA, U.K
,
J. R. Willis School of Mathematical Sciences, University of Bath, Bath, BA2 7AY, U.K.
,
D. H. J. Totterdell A.E.A. Technology, Harwell Laboratory, Oxon, OX 11 0RA, U.K
&
R. Bullough A.E.A. Technology, Harwell Laboratory, Oxon, OX 11 0RA, U.K
Pages 1151-1167 | Received 04 Sep 1991, Accepted 02 Oct 1991, Published online: 13 Sep 2006

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