Factors that govern sub-3 nm particle measurements in an Airmodus^® PSM and a TSI^® DEG–SMPS

Yiliang Liua College of Resources and Environment, Chongqing School, University of Chinese Academy of Sciences, Chongqing, China;b Shanghai Key Laboratory of Atmospheric Particle Pollution and Prevention (LAP3), Department of Environmental Science and Engineering, Fudan University, Shanghai, ChinaView further author information

Michel Attouib Shanghai Key Laboratory of Atmospheric Particle Pollution and Prevention (LAP3), Department of Environmental Science and Engineering, Fudan University, Shanghai, China;c LISA, UMR7583, Université Paris-Est-Créteil, Université de Paris, Institut Pierre Simon Laplace (IPSL), Créteil, FranceView further author information

Yueyang Lib Shanghai Key Laboratory of Atmospheric Particle Pollution and Prevention (LAP3), Department of Environmental Science and Engineering, Fudan University, Shanghai, ChinaView further author information

Jianmin Chenb Shanghai Key Laboratory of Atmospheric Particle Pollution and Prevention (LAP3), Department of Environmental Science and Engineering, Fudan University, Shanghai, ChinaView further author information

Qing Lib Shanghai Key Laboratory of Atmospheric Particle Pollution and Prevention (LAP3), Department of Environmental Science and Engineering, Fudan University, Shanghai, ChinaView further author information

Lin Wangb Shanghai Key Laboratory of Atmospheric Particle Pollution and Prevention (LAP3), Department of Environmental Science and Engineering, Fudan University, Shanghai, China;d Collaborative Innovation Center of Climate Change, Nanjing, China;e Shanghai Institute of Pollution Control and Ecological Security, Shanghai, China;f IRDR International Center of Excellence on Risk Interconnectivity and Governance on Weather/Climate Extremes Impact and Public Health, Fudan University, Shanghai, China;g National Observations and Research Station for Wetland Ecosystems of the Yangtze Estuary, Shanghai, ChinaCorrespondence[email protected]
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Factors that govern sub-3 nm particle measurements in an Airmodus^® PSM and a TSI^® DEG–SMPS

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Factors that govern sub-3 nm particle measurements in an Airmodus® PSM and a TSI® DEG–SMPS

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Factors that govern sub-3 nm particle measurements in an Airmodus^® PSM and a TSI^® DEG–SMPS