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Sequential Analysis
Design Methods and Applications
Volume 36, 2017 - Issue 4
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Original Articles

Purely sequential bounded-risk point estimation of the negative binomial means under various loss functions: Multi-sample problems

Nitis MukhopadhyayDepartment of Statistics, University of Connecticut–Storrs, Connecticut, USACorrespondence[email protected]
&
Sudeep R. BapatDepartment of Statistics, University of Connecticut–Storrs, Connecticut, USA;Department of Statistics and Applied Probability, University of California, Santa Barbara, California, USA
Pages 490-512 | Received 16 Apr 2017, Accepted 30 Jul 2017, Published online: 22 Jan 2018

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