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Integrated Ferroelectrics
An International Journal
Volume 38, 2001 - Issue 1-4
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Section H: High K materials and processes for frams and gate electrics

Structural characterization of strained (Ba0.5,Sr0.5)TiO3 thin films grown on Si by synchrotron X-ray diffraction

Sungjin Jun Dept. of Materials Engineering, Sung Kyun Kwan University, Suwon, 440–746, Korea
,
Sangsub Kim Dept. of Materials Science and Metallurgical Engineering, Sunchon National University, Sunchon, 540–742, Korea
,
Jungho Je Dept. of Materials Science and Engineering, Pohang University of Science and Technology, Pohang, 790–784, Korea
&
Jaichan Lee E-mail: [email protected]
Pages 201-210 | Received 14 Mar 2001, Published online: 19 Aug 2006

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