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Integrated Ferroelectrics
An International Journal
Volume 73, 2005 - Issue 1
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SECTION B: TESTING AND CHARACTERIZATION

ANALYSES OF C-V CHARACTERISTICS OF MFIS DEVICE UNDER HIGH AND LOW FREQUENCY

JI CHENG The Institute of Microelectronics, ASIC and System State Key Lab, Fudan University, Shanghai, 200433, China
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LIN YINYIN The Institute of Microelectronics, ASIC and System State Key Lab, Fudan University, Shanghai, 200433, China
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TANG TING-AO The Institute of Microelectronics, ASIC and System State Key Lab, Fudan University, Shanghai, 200433, China
Pages 57-65 | Received 17 Apr 2005, Published online: 11 Oct 2011

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