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Integrated Ferroelectrics
An International Journal
Volume 8, 1995 - Issue 3-4
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Original Articles

How to analyse relaxation and leakage currents of dielectric thin films: Simulation of voltage-step and voltage-ramp techniques

Guido W. Dietz Institut für Werkstoffe der Elektrotechnik (IWE), RWTH Aachen University of Technology, 52056, Aachen, Federal Republic of Germany
&
Rainer Waser Institut für Werkstoffe der Elektrotechnik (IWE), RWTH Aachen University of Technology, 52056, Aachen, Federal Republic of Germany
Pages 317-332 | Received 02 Jan 1995, Published online: 19 Aug 2006

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