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Integrated Ferroelectrics
An International Journal
Volume 24, 1999 - Issue 1-4
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Section A: Materials and processes for DRAMS

Structural properties of Ba0.6Sr0.4TiO3 thin films on epitaxial RuO2 electrodes

Q. X. Jia Materials and Science Technology Division, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, New Mexico, 87545, USA
,
C. Kwon Materials and Science Technology Division, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, New Mexico, 87545, USA
&
P. Lu Department of Materials Science and Engineering, New Mexico Tech, Socorro, New Mexico, 87801, USA
Pages 57-63 | Received 07 Mar 1999, Published online: 12 Sep 2006

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