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Science and Technology of Advanced Materials Volume 20, 2019 - Issue 1
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Optical, Magnetic and Electronic Device Materials

Electronic structures of MgO/Fe interfaces with perpendicular magnetization revealed by hard X-ray photoemission with an applied magnetic field

Shigenori Uedaa Research Center for Advanced Measurement and Characterization, National Institute for Materials Science, Tsukuba, Japan;b Synchrotron X-ray Station at SPring-8, National Institute for Materials Science, Hyogo, JapanCorrespondence[email protected]
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Masaki Mizuguchic Institute for Materials Research, Tohoku University, Sendai, Japan;d Center for Spintronics Research Network, Tohoku University, Sendai, Japan;e CREST, Japan Science and Technology Agency, Kawaguchi, JapanView further author information
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Masahito Tsujikawad Center for Spintronics Research Network, Tohoku University, Sendai, Japan;f Research Institute of Electrical Communication, Tohoku University, Sendai, JapanView further author information
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Masafumi Shiraid Center for Spintronics Research Network, Tohoku University, Sendai, Japan;f Research Institute of Electrical Communication, Tohoku University, Sendai, Japan;g Center for Science and Innovation in Spintronics (Core Research Cluster), Tohoku University, Sendai, JapanView further author information
Pages 796-804 | Received 28 Mar 2019, Accepted 16 Jun 2019, Published online: 17 Jul 2019

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