Journal of Information Display
Volume 22, 2021 - Issue 3
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Articles
A more reliable defect detection and performance improvement method for panel inspection based on artificial intelligence
Eui-Young Jeonga Inspection Equipment Development Team, Samsung Display, Yongin-si, KoreaCorrespondence[email protected]
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Jaewon Kima Inspection Equipment Development Team, Samsung Display, Yongin-si, KoreaView further author information
, Won-Hyouk Jangb AI Lab., Samsung Display, Yongin-si, KoreaView further author information
, Hyun-Chang Lima Inspection Equipment Development Team, Samsung Display, Yongin-si, KoreaView further author information
, Hanaul Noha Inspection Equipment Development Team, Samsung Display, Yongin-si, KoreaView further author information
& Jong-Myong Choib AI Lab., Samsung Display, Yongin-si, KoreaView further author information
Pages 127-136
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Received 26 Oct 2020, Accepted 28 Dec 2020, Published online: 28 Jan 2021
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