Advances in Physics: X
Volume 7, 2022 - Issue 1
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Frequency domain interferometry for measuring ultrafast refractive index modulation and surface deformation
Ronnie R. Tamminga Wellington UniVentures, Victoria University of Wellington, Wellington, New Zealand;b Robinson Research Institute, Faculty of Engineering, Victoria University of Wellington, Wellington, New Zealand;c MacDiarmid Institute for Advanced Materials and Nanotechnology, Wellington, New Zealand;d The Dodd-Walls Centre for Photonic and Quantum Technologies, Dunedin, New Zealand;e School of Chemical and Physical Sciences, Victoria University of Wellington, Kelburn, New ZealandView further author information
, Justin M. Hodgkissc MacDiarmid Institute for Advanced Materials and Nanotechnology, Wellington, New Zealand;e School of Chemical and Physical Sciences, Victoria University of Wellington, Kelburn, New ZealandCorrespondence[email protected]
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Kai Chena Wellington UniVentures, Victoria University of Wellington, Wellington, New Zealand;b Robinson Research Institute, Faculty of Engineering, Victoria University of Wellington, Wellington, New Zealand;c MacDiarmid Institute for Advanced Materials and Nanotechnology, Wellington, New Zealand;d The Dodd-Walls Centre for Photonic and Quantum Technologies, Dunedin, New ZealandView further author information
Article: 2065218
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Received 10 Feb 2022, Accepted 06 Apr 2022, Published online: 26 Apr 2022
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