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Journal of Trace and Microprobe Techniques Volume 21, 2003 - Issue 2
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INSTRUMENTATION, METHODOLOGY, AND TECHNICAL DEVELOPMENTS

Computation and Experiments on the Beam Spread in the VP-SEM: Application to X-Ray Microanalysis

A. Kadoun Laboratoire d'Elaboration et de Caractérisation des Matériaux, Université Djilali Liabès de Sidi Bel-Abbès, Sidi Bel-Abbès, Algérie
,
R. Belkorissat Laboratoire d'Elaboration et de Caractérisation des Matériaux, Université Djilali Liabès de Sidi Bel-Abbès, Sidi Bel-Abbès, Algérie
,
C. Mathieu Centre de Calcul et de Modélisation de Lens, Université d'Artois, Lens Cedex, FranceCorrespondencemathieu,univ-artois.fr
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B. Khelifa Centre de Calcul et de Modélisation de Lens, Université d'Artois, Lens Cedex, France
Pages 229-238 | Received 12 Jun 2002, Accepted 04 Nov 2002, Published online: 24 Jun 2008

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