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Journal of Trace and Microprobe Techniques Volume 21, 2003 - Issue 4
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INSTRUMENTATION, METHODOLOGY, AND TECHNICAL DEVELOPMENTS

Angular Dependence of L X-Ray Differential Cross-Section for In, Sn, Sb, and Te at 5.96 keV

L. Demir Department of Physics, Faculty of Arts and Sciences, Atatürk University, Erzurum, TurkeyCorrespondence[email protected]
,
M. Şahin Ispir Hamza Polat Profession High School, Atatürk University, Ispir, Erzurum, Turkey
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Y. Şahin Department of Physics, Faculty of Arts and Sciences, Atatürk University, Erzurum, Turkey
Pages 593-599 | Received 02 Oct 2002, Accepted 14 Jan 2003, Published online: 24 Jun 2008

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