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Ferroelectrics Volume 465, 2014 - Issue 1: Proceedings of the Thirteenth International Meeting on Ferroelectricity (IMF-13)
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Section D: Characterization of Thin Films

Structure and Electrical Properties of Bi0.5Na0.5TiO3 0-3 Composite Lead-Free Thick Films

Jinyan ZhaoElectronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, Xi’an Jiaotong University, Xi’an710049, China
,
Wei RenElectronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, Xi’an Jiaotong University, Xi’an710049, ChinaCorrespondence[email protected]
,
Hongfen JiElectronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, Xi’an Jiaotong University, Xi’an710049, China
,
Lingyan WangElectronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, Xi’an Jiaotong University, Xi’an710049, China
,
Xiaoqing WuElectronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, Xi’an Jiaotong University, Xi’an710049, China
&
Peng ShiElectronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, Xi’an Jiaotong University, Xi’an710049, China
Pages 7-12 | Received 02 Sep 2013, Accepted 26 Sep 2013, Published online: 01 May 2014

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