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Research Article

Effect of growth condition on the electrical behavior of BiFeO3/Si thin film devices

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Pages 172-179 | Received 21 Mar 2022, Accepted 31 Jul 2022, Published online: 05 Dec 2022

References

  • S. W. Cheong, and M. Mostovoy, Multiferroics: a magnetic twist for ferroelectricity, Nat. Mater. 6 (1), 13 (2007). DOI: 10.1038/nmat1804.
  • J. Dho et al., Large electric polarization and exchange bias in multiferroic BiFeO3, Adv. Mater. 18 (11), 1445 (2006). DOI: 10.1002/adma.200502622.
  • T. Kimura et al., Magnetic control of ferroelectric polarization, Nature 426 (6962), 55 (2003). DOI: 10.1038/nature02018.
  • F. Yan et al., Tailoring surface phase transition and magnetic behaviours in BiFeO3 via doping engineering, Sci. Rep. 5, 9128 (2015). DOI: 10.1038/srep09128.
  • S. Ning et al., Dependence of the thermal conductivity of BiFeO3 thin films on polarization and structure, Phys. Rev. Applied 8, 054049 (2017). DOI: 10.1103/PhysRevApplied.8.054049.
  • Ashish Ravalia et al., Role of oxygen in multiferroic behaviour of BiFeO3 films grown on 0.2%Nb-doped SrTiO3, Solid State Commun. 169, 10 (2013). DOI: 10.1016/j.ssc.2013.06.020.
  • P. K. Siwach et al., Anomalous ferromagnetism in spray pyrolysis deposited multiferroic BiFeO3 films, Appl. Phys. Lett. 91 (12), 122503 (2007). DOI: 10.1063/1.2785945.
  • Z. Chaodan et al., Synthesis and ferroelectric properties of BiFeO3 thin films grown by sputtering, Integr. Ferroelectr. 94 (1), 23 (2007). DOI: 10.1080/10584580701755815.
  • H. Yang et al., Oxygen concentration and its effect on the leakage current in BiFeO3 thin films, Appl. Phys. Lett. 96 (1), 012909 (2010). DOI: 10.1063/1.3291044.
  • S. C. Das et al., Phase pure epitaxial growth of BiFeO3 films: an effect of oxygen partial pressure, Solid State Commun. 264, 10 (2017). DOI: 10.1016/j.ssc.2017.07.013.
  • C.-C. Lee, and J.-M. Wu, Effect of film thickness on the interface and electric properties of BiFeO3 thin films, Appl. Surf. Sci. 253 (17), 7069 (2007). DOI: 10.1016/j.apsusc.2007.02.060.
  • F. Huang et al., Thickness-dependent structural and magnetic properties of BiFeO3 films prepared by metal organic decomposition method, Appl. Phys. Lett. 97 (22), 222901 (2010). DOI: 10.1063/1.3519986.
  • Y. H. Chu et al., Ferroelectric size effects in multiferroic BiFeO3 thin films, Appl. Phys. Lett. 90 (25), 252906 (2007). DOI: 10.1063/1.2750524.
  • H. Bea et al., Influence of parasitic phases on the properties of BiFeO3 epitaxial thin films, Appl. Phys. Lett. 87 (7), 072508 (2005). DOI: 10.1063/1.2009808.
  • M. Mayer, SIMNRA, a simulation program for the analysis of NRA, RBS and ERDA. Proc. AIP Conf. 475 (1), 541 (1999). DOI: 10.1063/1.59188.
  • S. H. Lim et al., The effects of multiphase formation on strain relaxation and magnetization in multiferroic BiFeO3 thin films, Adv. Funct. Mater 17 (14), 2594 (2007). DOI: 10.1002/adfm.200700055.
  • W. Schottky, Halbleitertheorie der Sperrschicht, Naturwiss 26, 843 (1938). DOI: 10.1007/BF01774216.
  • N. F. Mott and R .W. Gurney, Electronic Processes in Ionic Crystals, Clarendon, Oxford, 18, 249 (1940). DOI: 10.1021/ed018p249.1.
  • M.A. Lampert and P. Mark, Current Injectin in Solids, Academic, New York, 170, 966 (1970). DOI: 10.1126/science.170.3961.966.b.
  • J. Frenkel, Tech. Phys. USSR 5, 685 (1938). DOI: 10.1103/PhysRev.54.647.

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