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Original Articles

Director and layer structure of SSFLC cells

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Pages 79-97 | Published online: 08 Feb 2011

References

  • Clark , N. A. and Lagerwall , S. T. 1980 . Appl. Phys. Lett. , 36 : 899
  • Ferroelectrics . 1984 . Volumes 58 and 59
  • Rieker , T. P. , Clark , N. A. , Smith , G. S. , Parmar , D. S. , Sirota , E. B. and Safinya , C. R. 1987 . Phys. Rev. Lett. , 59 : 2658
  • Clark , N. A. and Rieker , T. P. 1988 . Phys. Rev. A , 37 : 1053
  • Clark , N. A. and Lagerwall , S. T. 1986 . Proc. 6th International Display Research Conference Tokyo, , Japan
  • Meyer , R. B. 1977 . Mol. Cryst. Liq. Cryst. , 40 : 33
  • Clark , N. A. and Lagerwall , S. T. 1984 . Ferroelectrics , 59 : 25
  • Freidel , G. 1922 . Ann. Phys. (Paris) , 18 : 277
  • Handschy , M. A. and Clark , N. A. 1984 . Ferroelectrics , 59 : 69
  • The size of the smallest region which can be probed depends on the cell thickness and beam intensity. With a typical SSFLC cell (thickness t =2μm) and an 18KW rotating anode laboratory generator, sample areas greater than ≃ 3 mm × 3 mm are required for a reasonable signal. With a high intensity synchrotron diffractometer such as beamline VII-2 at SSRL, areas as small as 50 μm × 50 μm can be studied. Effective detection of the scattering from a micron thick liquid crystal layer between glass plates several hundred times thicker requires a diffractometer with sufficiently high angular resolution.
  • This behavior is quite different from that found upon cooling a bulk sample through a second order SA to SC transition with a magnetic field applied. In the bulk case the director orients along the field direction, z, in the SA phase with the layers normal to z and having a pitch (length per layer along z) PA = d A Upon cooling into the SC phase, the layers tilt through the director tilt angle θ( T) < δ( T), implies pc < PA. In the bulk case then the increasing pitch as the temperature is lowered in the SC phase requires the loss of layers, a condition forced by the magnetic field induced orientation constraint on n. See C. R. Safinya, M. Kaplan, J. Als-Nielsen, R. J. Birgenau, D. Davidov, and J. D. Litster, Phys. Rev. A 34 4363 1986.
  • Ouchi , Y. , Takano , H. , Takezoe , H. and Fukuda , A. 1988 . Jap. J. Appl. Phys. , to appear and this conference
  • Rieker , T. P. , Clark , N. A. and Handschy , M. A. to be published
  • Rieker , T. P. and Clark , N. A. Appl. Phys. Lett. , submitted to
  • Hiji , N. , Chandani , A. D. L. , Nishiyama , S. , Ouchi , Y. , Takezoe , H. and Fukuda , A. this conference
  • Xue , J. , Clark , N. A. and Meadows , M. R. 1988 . Phys. Rev. Lett. , submitted to
  • Ouchi , Y. , Takezoe , H. and Fukuda , A. 1987 . Jap. J. Appl. Phys. , 26 : 1
  • Maclennan , J. E. 1988 . Ph. D. thesis, University of Colorado .
  • Zhuang , Z. and Clark , N. A. (to be published) I. Dahl (this conference)
  • Handschy , M. A. and Clark , N. A. 1982 . Appl. Phys. Lett. , 41 : 39

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