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Ferroelectrics Volume 82, 1988 - Issue 1
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Original Articles

A microwave dielectric measurement technique for high permitivity materials

M. T. Lanagan Materials Research Lab, The Pennsylvania State University, University Park, PA, USA
,
J. H. Kim Materials Research Lab, The Pennsylvania State University, University Park, PA, USA
,
D. C. Dube Materials Research Lab, The Pennsylvania State University, University Park, PA, USA
,
S. J. Jang Materials Research Lab, The Pennsylvania State University, University Park, PA, USA
&
R. E. Newnham Materials Research Lab, The Pennsylvania State University, University Park, PA, USA
Pages 91-97 | Received 14 Oct 1987, Published online: 08 Feb 2011

References

  • Chance , D. A. , Ho , C. W. , Bajorek , C. H. and Sampogna , M. 1982 . IEEE Components, Hybrids and Manufacturing Tech. , 5 : 368
  • Reiley , T. C. , Badding , J. V. , Payne , D. A. and Chance , D. A. 1984 . Mat. Res. Bull. , 19 : 1543
  • Lanagan , M. T. 1987 . Ph.D. Thesis The Pennsylvania State University .
  • von Hippel , A. R. 1966 . Dielectric Materials and Applications , Cambridge : MA MIT Press .
  • Atwater , H. A. 1962 . Introduction to Microwave Theory , Tokyo : McGraw-Hill .
  • van Gemert , M. J. C. 1973 . Phillips Res. Repts. , 28 : 530
  • Lighart , L. P. 1983 . IEEE Trans. on Microwave Theory and Tech. , MIT-31 : 249
  • Stuchly , S. S. and Matuszewski , M. 1978 . IEEE Trans. on Instrument. and Meas. , IM-27 : 288
  • Horton , J. B. and Burdick , G. A. 1968 . IEEE Trans. on Microwave Theory and Tech. , MTT-16 : 873
  • Hewlett-Packard . Measuring dielectric constant with the HP 8510T network analyzer. Product Note 8510–3.

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