Circuit fault detection model using multiclass support vector machine

References

• Bao, G., Zeng, F., & Sun, H. (2019, July). Design of a short-circuit detection intelligent release using discrete wavelet algorithm. IEEE Access, 7, 104228–104240. https://doi.org/10.1109/ACCESS.2019.2931704
   Google Scholar
• Gabriel Gheorghe, A., & Constantinescu, F. (2010). Solution computation for resistive circuits containing companion models. UPB Scientific Bulletin Series C Electrical Engineering and Computer Science, 72(4), 193–204.
   Google Scholar
• Gorla, N. B. Y., Kolluri, S., Chai, M., & Panda, S. K. (2021, August). A novel open-circuit fault detection and localization scheme for cascaded H-Bridge stage of a three-stage solid-state transformer. IEEE Transactions on Power Electronics, 36(8), 8713–8729. https://doi.org/10.1109/TPEL.2019.2918148
   Web of Science ®Google Scholar
• Huang, W., Du, J., Hua, W., & Fan, Q. (2021, September). An open-circuit fault diagnosis method for PMSM drives using symmetrical and DC components. Chinese Journal of Electrical Engineering, 7(3), 124–135. https://doi.org/10.23919/CJEE.2021.000031
   Google Scholar
• Ji, L., Fu, C., & Sun, W. (2021, July). Soft fault diagnosis of analog circuits based on a ResNet with circuit spectrum map. IEEE Transactions on Circuits & Systems I: Regular Papers, 68(7), 2841–2849. https://doi.org/10.1109/TCSI.2021.3076282
   Web of Science ®Google Scholar
• Kumar, M. (2021, April). Open circuit fault detection and switch identification for LS-PWM H-Bridge inverter. IEEE Transactions on Circuits & Systems II: Express Briefs, 68(4), 1363–1367. https://doi.org/10.1109/TCSII.2020.3035241
   Web of Science ®Google Scholar
• Lamb, J., & Mirafzal, B. (2017, June). Open-circuit IGBT fault detection and location isolation for cascaded multilevel converters. IEEE Transactions on Industrial Electronics, 64(6), 4846–4856. https://doi.org/10.1109/TIE.2017.2674629
   Web of Science ®Google Scholar
• Liu, Z., Chaganti, S. K., & Chen, D. (2018, May). Improving time-efficiency of fault-coverage simulation for MOS analog circuit. IEEE Transactions on Circuits & Systems I: Regular Papers, 65(5), 1664–1674. https://doi.org/10.1109/TCSI.2017.2751561
   Web of Science ®Google Scholar
• Liu, Z., Liu, T., Han, J., Bu, S., Tang, X., & Pecht, M. (2017, January). Signal model-based fault coding for diagnostics and prognostics of analog electronic circuits. IEEE Transactions on Industrial Electronics, 64(1), 605–614. https://doi.org/10.1109/TIE.2016.2599142
   Web of Science ®Google Scholar
• Mohamed Sathik, M. H., Sundararajan, P., Sasongko, F., Pou, J., & Vaiyapuri, V. (2020, December). Short circuit detection and fault current limiting method for IGBTs. IEEE Transactions on Device and Materials Reliability, 20(4), 686–693. https://doi.org/10.1109/TDMR.2020.3018717
   Web of Science ®Google Scholar
• Nagamani, A. N., Anuktha, S. N., Nanditha, N., & Agrawal, V. K. (2018, February). A genetic algorithm-based Heuristic method for test set generation in reversible circuits. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 37(2), 324–336. https://doi.org/10.1109/TCAD.2017.2695881
   Web of Science ®Google Scholar
• Parvin, S., & Altun, M. (2019, November). Perfect concurrent fault detection in CMOS logic circuits using parity preservative reversible gates. IEEE Access, 7, 163939–163947. https://doi.org/10.1109/ACCESS.2019.2951279
   Web of Science ®Google Scholar
• Ranjan, A., Ghosh, M., Paul, S. K. (2012). Voltage-mode third order band pass filter employing operational trans resistance amplifier. 2012 5th International Conference on Computers and Devices for Communication, Kolkata, India (pp. 1–3). https://doi.org/10.1109/CODEC.2012.6509215
   Google Scholar
• Tadeusiewicz, M., & Hałgas, S. (2022). A method for parametric and catastrophic fault diagnosis of analog linear circuits. IEEE Access, 10, 27002–27013. https://doi.org/10.1109/ACCESS.2022.3157647
   Web of Science ®Google Scholar
• Yeap, Y. M., Geddada, N., Satpathi, K., & Ukil, A. (2018, October). Time- and frequency-domain fault detection in a VSC-interfaced experimental DC test system. IEEE Transactions on Industrial Informatics, 14(10), 4353–4364. https://doi.org/10.1109/TII.2018.2796068
   Web of Science ®Google Scholar
• Yu, Y., Jiang, Y., & Peng, X. (2018). Multi-frequency test generation for incipient faults in analog circuits based on the aliasing measuring model. IEEE Access, 6, 34724–34735. https://doi.org/10.1109/ACCESS.2018.2849697
   Web of Science ®Google Scholar
• Zoraghchian, A., Didehban, M., & Mehrabian, M. (2016, January). A fault detection method for combinational circuits. International Journal of Advanced Network, Monitoring and Controls, 1(1), 1–5. https://doi.org/10.21307/ijanmc-2016-004
   Google Scholar