113
Views
8
CrossRef citations to date
0
Altmetric
Original Articles

Availability-adjusted X-factor

, , , &
Pages 3933-3953 | Received 01 Jan 2005, Published online: 22 Feb 2007

References

References

  • Adams , J , Balas , E and Zawack , D . 1988 . The shifting bottleneck procedure for job shop scheduling. . Manage. Sci. , 34 : 391 – 401 .
  • Cassandras C Discrete Event Systems: Modeling and Performance Analysis 1993 Irwin Homewood IL
  • Cox DR Reid N The Theory of the Design of Experiments 2000 Chapman & Hall/CRC New York
  • Delp D Si J Hwang Y Pei B A systematic study of the X-factor in relation to effective system capacity. Submitted
  • Factory Explorer®, v.2.8. Wright Williams & Kelly, 2003. Available online at:, http://www.wwk.com accessed 3 July 2003
  • Foster , J , Nugent , T and Marcoux , P . Implementation of best known methods, in . 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) , 2000 pp. 181–186
  • Fowler J SEMATECH Dataset 1, Modeling and Analysis for Semiconductor Manufacturing Laboratory web site, Arizona State University, Tempe, AZ, 2003. Available online at:, http://www.eas.asu.edu/~masmlab/ accessed 20 May 2003
  • Fowler JW Brown S Gold H Schoemig A Measurable improvements in cycle-time-constrained capacity, in Proceedings of the Sixth International Symposium on Semiconductor Manufacturing (ISSM) pp. A21–A24 1997
  • Goldratt EM Cox J The Goal: A Process of Ongoing Improvement 2nd ed. 1992 North River Press Great Barrington MA
  • Hopp WJ Spearman ML Factory Physics 2nd ed. 2001 Irwin McGraw-Hill New York
  • Jacobs , JH , Etman , LFP , Rooda , JE and van Campen , EJJ . Quantifying operational time variability: the missing parameter for cycle time reduction, in . 2001 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) , 2001 pp. 1–10
  • Kishimoto , M , Ozawa , K , Watanabe , K and Martin , DP . 2001 . Optimized operations by extended X-factor theory including unit hours concept. . IEEE Trans. Semicond. Manuf. , 14 : 187 – 195 .
  • Lee , YH , Park , J and Kim , S . 2002 . Experimental study on input and bottleneck scheduling for a semiconductor fabrication line. . IIE Trans. , 34 : 179 – 190 .
  • Martin DP Optimizing manufacturing asset utilization in 1996 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) 1996
  • Martin , DP . The advantages of using short cycle time manufacturing (SCM) instead of continuous flow manufacturing (CFM), in . 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) , 1998 pp. 43–49
  • Montgomery DC Design and Analysis of Experiments 3rd ed. 1991 Wiley New York
  • Occhino , TJ . Capacity planning model: the important inputs, formulas, and benefits, in . 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) , 2000 pp. 455–458
  • Ozawa , K , Wada , H and Yamaguchi , T . Optimum tool planning using the X-factor theory, in . Proceedings of the 1999 IEEE International Symposium on Semiconductor Manufacturing (ISSM). , 1999 pp. 49–52
  • Schoemig , AK . On the corrupting influence of variability in semiconductor manufacturing, in . Proceedings of the 1999 Winter Simulation Conference (WSC). , 1999 pp. 837–842
  • Semiconductor Equipment and Materials International (SEMI), SEMI E10-96 Specification for Definition and Measurement of Equipment Reliability, Availability, and Maintainability (RAM) 1996
  • Semiconductor Equipment and Materials International (SEMI), SEMI E124 Provisional Guideline for Definition and Calculation of Overall Factory Efficiency (OFE) and Other Associated Factory-Level Productivity Metrics 2003
  • Srivatsan , N and Kempf , K . Effective modeling of factory throughput times, in . IEEE/CPMT International Electronics Manufacturing Technology Symposium. , 1995 pp. 377–383
  • The Mathworks, Matlab®, v. 6.5, 2004. Available at, http://www.mathworks.com accessed 29 January 2004
  • Wein , LM . 1988 . Scheduling semiconductor wafer fabrication. . IEEE Trans. Semicond. Manuf. , 1 : 115 – 130 .

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.