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Original Articles

Constructing the OGE for promoting tool group productivity in semiconductor manufacturing

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Pages 509-524 | Received 01 Mar 2006, Published online: 22 Dec 2006

References

  • Chien , C-F and Wu , J . 2003 . Analyzing repair decisions in the site imbalance problem of semiconductor test machines . IEEE Trans. Semiconductor Manuf. , 16 ( 4 ) : 704 – 711 .
  • Chien , C-F , Chang , K and Chen , C . 2003 . Design of sampling strategy for measuring and compensating overlay errors in semiconductor manufacturing . Int. J. Prod. Res. , 41 ( 11 ) : 2547 – 2561 .
  • Chien , C-F , Hsiao , A and Wang , I . 2004 . Constructing semiconductor manufacturing performance indexes and applying data mining for manufacturing data analysis . J. Chin. Inst. Indust. Eng. , 21 ( 4 ) : 313 – 327 .
  • Chien , C-F and Hsu , C . 2006 . A novel method for determining machine subgroups and backups with an empirical study for semiconductor manufacturing . J. Intelligent Manuf. , 17 ( 5 ) : 1 – 12 .
  • Dabbas , RM , Fowler , JW , Rollier , DA and Mccarville , D . 2003 . Multiple response optimization using mixture-designed experiments and desirability functions in semiconductor scheduling . Int. J. Prod. Res. , 41 ( 5 ) : 936 – 961 .
  • de Ron , AJ and Rooda , JE . 2005 . Equipment effectiveness: OEE revisited . IEEE Trans. Semiconductor Manuf. , 18 ( 1 ) : 190 – 196 .
  • Gardner , M , Bieker , J and Elwell , S . 2000 . Solving tough semiconductor manufacturing problems using data mining . IEEE/SEMI Advanced Semiconductor Manufacturing Conference , : 46 – 55 .
  • Hopp , WJ and Spearman , ML . 2000 . Factory Physics: Foundations of Manufacturing Management , 2nd , Boston, MA : Irwin/McGraw-Hill .
  • Huang , SH , Dismukes , J , Shi , J , Su , Q , Razzak , MA , Bodhale , B and Robinson , E . 2003 . Manufacturing productivity improvement using effectiveness metrics and simulation analysis . Int. J. Prod. Res. , 41 ( 3 ) : 513 – 527 .
  • Jeong , K and Philips , DT . 2001 . Operational efficiency and effectiveness measurement . Int. J. Oper. Prod. Manage. , 21 ( 11 ) : 1404 – 1416 .
  • Leachman , RC . 1997 . Closed-loop measurement of equipment efficiency and equipment capacity . IEEE Trans. Semiconductor Manuf. , 10 ( 1 ) : 84 – 97 .
  • Nakajima , S . 1988 . Introduction to Total Productive Maintenance , Cambridge, MA : Productivity Press .
  • Oechsner , R , Pfeffer , M , Pfitzner , L , Binder , H , Müller , E and Vonderstras , T . 2003 . From overall equipment efficiency (OEE) to overall Fab effectiveness (OFE) . Mater. Sci. Semiconductor Processing , 5 : 333 – 339 .
  • Peng , C and Chien , C . 2003 . Data value development to enhance yield and maintain competitive advantage for semiconductor manufacturing . Int. J. Services Technol. Manage. , 4 ( 4–6 ) : 365 – 383 .
  • SEMI E79-0200 . 2000 . “ Standard for definition and measurement of equipment productivity ” . In Semiconductor Equipment and Material International Mountain View, CA
  • SEMI E10-0701 . 2001 . “ Specification for definition and measurement of equipment reliability, availability, and maintainability (RAM) ” . In Semiconductor Equipment and Material International Mountain View, CA
  • Uzsoy , R , Lee , C-Y and Martin-Vega , L . 1994 . A review of production planning and scheduling models in the semiconductor industry – part II: Shop-floor control . IIE Trans. , 26 ( 5 ) : 44 – 55 .

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