Controlling non-conformities propagation in manufacturing

References

• Baud-Lavigne, B., S. Bassetto, and B. Penz. 2010. “A Broader View of the Economic Design of the X-Bar Chart in the Semiconductor Industry.” International Journal of Production Research 49 (19): 5843–5857.
   Web of Science ®Google Scholar
• Berman, B. 1999. “Planning for the Inevitable Product Recall.” Business Horizons 42 (2): 69–78.
   Google Scholar
• Bettayeb, B., P. Vialletelle, S. Bassetto, and M. Tollenaere. 2010. “Optimized Design of Control Plans Based on Risk Exposure and Resources Capabilities.” In International Symposium on Semiconductor Manufacturing. Paper presented at 28th ISSM Annual Conference, October 18-20, in Tokyo, Japan. 1–4.
   Google Scholar
• Bettayeb, B., S. Bassetto, P. Vialletelle, and M. Tollenaere. 2012a. “Quality and Exposure Control in Semiconductor Manufacturing. Part II: Evaluation.” International Journal of Production Research 50 (23): 6852–6869.
   Web of Science ®Google Scholar
• Bettayeb, B., S. Bassetto, P. Vialletelle, and M. Tollenaere. 2012b. “Quality and Exposure Control in Semiconductor Manufacturing. Part I: Modelling.” International Journal of Production Research 50 (23): 6835–6851.
   Web of Science ®Google Scholar
• Bousetta A., and A. J. Cross. 2005. “Adaptive Sampling Methodology for In-Line Defect Inspection.” In Advanced Semiconductor Manufacturing Conference and Workshop, 2005 IEEE/SEMI, April 11–12, in Munich, Germany. 25–31.
   Google Scholar
• Box, G. E. P., and G. C. Tiao. 1975. “Intervention Analysis with Applications to Economic and Environmental Problems.” Journal of the American Statistical Association 70 (349): 70–79.
   Web of Science ®Google Scholar
• Chen, Y. K., K. L. Hsieh, and C. C. Chang. 2007. “Economic Design of the VSSI Control Charts for Correlated Data.” International Journal of Production Economics 107 (2): 528–539.
   Web of Science ®Google Scholar
• Duijm, N. J. 2009. “Safety-Barrier Diagrams as a Safety Management Tool.” Reliability Engineering & System Safety 94 (2): 332–341.
   Web of Science ®Google Scholar
• Fiegenwald, V., S. Bassetto, and M. Tollenaere. 2011. “Controlling Non-Conformities Propagation in Manufacturing. Case Study in an Electromechanical Assembly Plant.” In IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, 1476–1480.
   Google Scholar
• Gowland, R. 2006. “The Accidental Risk Assessment Methodology for Industries (ARAMIS)/Layer of Protection Analysis (LOPA) Methodology: A Step Forward towards Convergent Practices in Risk Assessment?” Journal of Hazardous Materials 130 (3): 307–310.
   PubMed Web of Science ®Google Scholar
• Hollnagel, E. 2008. “Risk + Barriers = Safety?” Safety Science 46 (2): 221–229.
   Web of Science ®Google Scholar
• Hora, M., H. Bapuji, and A. V. Roth. 2011. “Safety Hazard and Time to Recall: The Role of Recall Strategy, Product Defect Type, and Supply Chain Player in the U.S. Toy Industry.” Journal of Operations Management 29 (7): 766–777.
   Web of Science ®Google Scholar
• Hsu, L. F., and C. S. Tapiero. 1989. “Quality Control of the M/G/1 Queue.” European Journal of Operational Research 42 (1): 88–100.
   Web of Science ®Google Scholar
• Jacobs, R. M. 1996. “Product Recall–a Vendor/Vendee Nightmare.” Microelectronics and Reliability 36 (1): 101–103.
   Web of Science ®Google Scholar
• Jina, J., A. K. Bhattacharya, and A. D. Walton. 1997. “Applying Lean Principles for High Product Variety and Low Volumes: Some Issues and Propositions.” Logistics Information Management 10 (1): 5–13.
   Google Scholar
• Lorenzen, T. J., and L. C. Vance. 1986. “The Economic Design of Control Charts: A Unified Approach.” Technometrics 28 (1): 3–10.
   Web of Science ®Google Scholar
• Montgomery, D. C. 2007. Introduction to Statistical Quality Control. New York: Wiley.
   Google Scholar
• Montgomery, D. C. 2010. “Trouble at Toyota.” Quality and Reliability Engineering International 26 (6): 521–521.
   Web of Science ®Google Scholar
• Mukhopadhyay, S. K., and R. Setaputra. 2007. “A Dynamic Model for Optimal Design Quality and Return Policies.” European Journal of Operational Research 180 (3): 1144–1154.
   Web of Science ®Google Scholar
• Pfitzner, L., R. Oechsner, C. Schneider, H. Ryssel, M. Riemer, and M. von Podewils. 1999. “Novel Process Control Strategies for 300 mm Semiconductor Production.” Microelectronic Engineering 45 (2–3): 247–256.
   Web of Science ®Google Scholar
• Prabhu, S. S., D. C. Montgomery, and G. C. Runger. 1997. “Economic-Statistical Design of an Adaptive Chart.” International Journal of Production Economics 49 (1): 1–15.
   Web of Science ®Google Scholar
• Salvi, O., and B. Debray. 2006. “A Global View on ARAMIS, a Risk Assessment Methodology for Industries in the Framework of the SEVESO II Directive.” Journal of Hazardous Materials 130 (3): 187–199.
   PubMed Web of Science ®Google Scholar
• Schippers, W. A. J. 1999. “The Process Matrix, a Simple Tool to Analyse and Describe Production Processes.” Quality and Reliability Engineering International 15 (6): 469–473.
   Web of Science ®Google Scholar
• Sklet, S. 2006. “Safety Barriers: Definition, Classification, and Performance.” Journal of Loss Prevention in the Process Industries 19 (5): 494–506.
   Web of Science ®Google Scholar
• Sugimori, Y., K. Kusunoki, F. Cho, and S. Uchilawa. 1997. “Toyota Production System and Kanban System Materialization of Just-In-Time and Respect-for-Human System.” International Journal of Production Research 15 (6): 553–564, 1977.
   Google Scholar
• Summers, A. E. 2003. “Introduction to Layers of Protection Analysis.” Journal of Hazardous Materials 104 (1–3): 163–168.
   PubMed Web of Science ®Google Scholar
• Walsh, D. A. 2008. “Lean Transformation of a Supply Chain Organization” MBA, MSc thesis, MIT.
   Google Scholar