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Original Articles

Detection of all single and multiple stuck-at faults in combinational digital circuits using index vector testing

Pages 1489-1502 | Received 12 Dec 1988, Published online: 24 Oct 2007

REFERENCES

  • BHATTACHARYYA , B. B. , and GUPTA , B. , 1983 Syndrome testable design of combinational networks for detecting stuck-at and bridging faults . Proc, Int. Test Conference , Paper No. 15.3 , pp. 446 – 452 .
  • MILLER , D. M. , and MUZIO , J. C. , 1984 , I.E.E.E. Trans. Comput. , 33 , 765 .
  • SAVIR , J. , 1980 , I.E.E.E. Trans. Comput. , 29 , 442 ( For corrections: November 1980); 1981, Ibid., 30, 606 .
  • SAXENA , N. R. , and ROBINSON , J. P. , 1986 , I.E.E.E. Trans. Comput. , 35 .
  • SEN GUPTA , I. , 1987 , Index vector testing of combinational circuits . Proc. Int. Test Conference , Paper No. 47.2 , pp. 1108 – 1112 .
  • SEN GUPTA , I. , and CHOUDHURY , D. R. , 1987 , Design of a combinational circuit tester based on index vector testing . Proc. International Symposium on Electronic Devices, Circuits and Systems , Kharagpur , FT1.3 , pp. 627 – 629 .
  • SUSSKIND , A. K. , 1983 , I.E.E.E. Trans. Comput. , 32 , 198 .

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