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International Journal of Systems Science Volume 28, 1997 - Issue 4
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Original Articles

Joint effect of test effort and learning factor on software reliability and optimal release policy

S. CHATTERJEE Department of Mathematics, Indian Institute or Technology, Kharagpur, 721 302, India
,
R. B. MISRA Department of Electrical Engineering, Indian Institute of Technology, Kharagpur, 721 302, India
&
S. S. ALAM Department of Mathematics, Indian Institute or Technology, Kharagpur, 721 302, India
Pages 391-396 | Received 31 Jul 1996, Accepted 30 Sep 1996, Published online: 05 Apr 2007

References

  • GOEL , A. L. , 1985 , Software reliability models: assumptions, limitations, & applications . IEEE Transactions on Software Engineering , 11 , 1411 – 1423 .
  • GOEL , A. L. , and OKUMOTO , K. , 1979 , A time dependent error detection rate model for software reliability and other performance measures . IEEE Transactions on Reliability , 28 , 206 – 211 .
  • OKUMOTO , K. , and GOEL , A. L. , 1980 , Optimal release time for software systems based on reliability and cost criteria . Journal of Systems and Software , 1 , 315 – 318 .
  • YAMADA , S. , and OSAKI , S. 1985 , Cost-reliability optimal release policies for software systems , IEEE Transactions on Reliability , 34 , 422 – 424 .
  • YAMADA , S. , HISHITANI , J. , and OSAKI , S. , 1993 , Software reliability growth with a Weibull test-effort: a model application , IEEE Transactions on Reliability , 42 , 100 – 105 .
  • YAMADA , S. , OHBA , M. , and OSAKI , S. , 1983 , S-shaped reliability growth modeling for software error detection . IEEE Transactions on Reliability , 32 , 475 – 478 ; 1984, S-shaped software reliability growth models and their applications. IEEE Transactions on Reliability, 33, 289–291 .
  • YAMADA , S. , OHTERIA , H. , and NARIHISA , H. , 1986 , Software reliability growth models with testing-effort , IEEE Transactions on Reliability , 35 , 19 – 23 .
  • XIA , G. , ZEEPHONGSEKUL , P. , and KUMAR , S. , 1992 , Optimal software release policies for models incorporating learning in testing , Asia Pacific Journal of Operational Research , 9 , 221 – 234 ; 1993, Optimal software release policy with a learning factor for imperfect debugging. Microelectronics Reliability, 33, 81–86 .

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