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Article

Ultrasensitive detection of low-dose gamma radiation using polymeric thin films on microelectromechanical system-based sensors

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Pages 1567-1575 | Received 06 Jan 2022, Accepted 02 May 2022, Published online: 16 Jun 2022

References

  • K.P. Kumar, G.S. Sundaram, B. Sharma, S. Venkatesh, R. Thiruvengadathan, Nuclear Engineering and Technology, 52 (2020) 2151–2161.
  • F. El Ghissassi, R. Baan, K. Straif, Y. Grosse, B. Secretan, V. Bouvard, L. Benbrahim-Tallaa, N. Guha, C. Freeman, L. Galichet, The lancet oncology, 10 (2009) 751–752.
  • J.-Y. Gan, Y. Chang, T. Wu, Appl. Phys, 72 (1998) 332–334.
  • R. Qindeel, Results Phys., 7 (2017) 807–809.
  • I. Kabacelik, H. Kutaruk, S. Yaltkaya, R. Sahin, J Radiation Physics and Chemistry, 134 (2017) 89–92.
  • A.E.-N.A. Mohamed, N.A. Ayad, A. Nabih, Z. Rashed, H. El-Hageen, Int. J. Com. Sci. Telecom, 2 (2011) 15–22.
  • M.K. Hossain, M. Rahman, M. Basher, M. Afzal, M. Bashar, Results Phys., 11 (2018) 1172–1181.
  • M. Pervez, M. Mia, S. Hossain, S. Saha, M. Ali, P. Sarker, M.K. Hossain, M. Matin, M. Hoq, M. Chowdhury, Optik, 162 (2018) 140–150.
  • S. Saha, M. Ali, M.F. Hossen, M.F. Pervez, M. Mia, M.K. Hossain, M.S. Haque, 2018 International Conference on Computer, Communication, Chemical, Material and Electronic Engineering (IC4ME2), IEEE2018, pp. 1–4.
  • M.K. Hossain, M. Rahman, M. Basher, M. Manir, M. Bashar, Optik, 178 (2019) 449–460.
  • M. Rahman, M.A. Hoque, G. Rahman, M. Azmi, M. Gafur, R.A. Khan, M.K. Hossain, Radiation Effects and Defects in Solids, 174 (2019) 480–493.
  • H. Diab, A. Ibrahim, R. El-Mallawany, Measurement, 46 (2013) 3635–3639.
  • S. Magne, J. Bouvet, G. Ranchoux, P. Ferdinand, Journées nationales d’optique guidée, Limoges, (2001).
  • G. Ranchoux, S. Magne, J. P. Bouvet, P. Ferdinand, Radiation protection dosimetry, 100 (2002) 255–260.
  • M. Slapa, M. Traczyk, 1995 IEEE Nuclear Science Symposium and Medical Imaging Conference Record, IEEE1995, pp. 814–818.
  • L. AP Santos, E. F. da Silva Jr, E. Vilela, Radiation protection dosimetry, 101 (2002) 145–148.
  • N. Tsoulfanidis, S. Landsberger, Measurement & detection of radiationCRC press2021.
  • X. Dong, F. Hu, Z. Liu, G. Zhang, D. Zhang, Chemical Communications, 51 (2015) 3892–3895.
  • N. Alanazi, A.N. Alodhayb, A. Almutairi, H. Alshehri, S. AlYemni, G. Alsowygh, S. Abdulmawla, K. Shamma, H. Albrithen, M. Muthuramamoorthy, Materials, 14 (2021) 7035.
  • A. Alodhayb, N. Brown, S. Saydur Rahman, R. Harrigan, L. Beaulieu, J Applied Physics Letters, 102 (2013) 173106.
  • A. Alodhayb, F. Khan, H. Etayash, T. Thundat, J Journal of The Electrochemical Society, 167 (2019) 037504.
  • B. Safibonab, A. Reyhani, A.N. Golikand, S. Mortazavi, S. Mirershadi, M. Ghoranneviss, Appl.Surf. Sci., 258 (2011) 766–773.
  • J. Colombani, E. Chauvet, S. Amat, N. Dupuy, D. Gigmes, Anal. Chim. Acta, 960 (2017) 53–62.
  • M. Sayyed, G. Lakshminarayana, I. Kityk, M. Mahdi, Radiat. Phys. Chem., 139 (2017) 33–39.
  • Q. Wu, A. Allouch, I. Martins, N. Modjtahedi, E. Deutsch, J.-L. Perfettini, J Biomedical journal, 40 (2017) 200–211.
  • F. Boehm, R. Edge, T.G. Truscott, C. Witt, FEBS Lett., 590 (2016) 1086–1093.
  • R. Datar, S. Kim, S. Jeon, P. Hesketh, S. Manalis, A. Boisen, T. Thundat, MRS Bulletin, (2009).
  • T.D. Caliskan, D.A. Bruce, M.F.J.J.o.M. Daqaq, Microengineering, 30 (2020) 045005.
  • F. Ejeian, S. Azadi, A. Razmjou, Y. Orooji, A. Kottapalli, M.E. Warkiani, M.J.S. Asadnia, A.A. Physical, 295 (2019) 483–502.
  • J. Lim, M. Ratnam, I. Azid, D. Mutharasu, Experimental mechanics, 50 (2010) 1051–1060.
  • A. Gupta, D. Akin, R. Bashir, J Applied Physics Letters, 84 (2004) 1976–1978.
  • B. Ilic, H.G. Craighead, S. Krylov, W. Senaratne, C. Ober, P. Neuzil, Int. J. Appl. Phys., 95 (2004) 3694–3703.
  • P.M. Moubarak, P. Ben-Tzvi, M.E. Zaghloul, J IEEE Sensors Journal, 12 (2011) 1033–1042.
  • O. Frazão, L. Marques, J. Marques, J. Baptista, J. Santos, J Optics Communications, 279 (2007) 68–71.
  • H. Yu, P. Xu, X. Xia, D.-W. Lee, X. Li, J IEEE Transactions on Industrial Electronics, 59 (2011) 4881–4887.
  • A. Alodhayb, K. Shamma, N. Alanazi, N. Alkathran, H. Albrithen, Radiat. Phys. Chem., (2021) 109745.
  • K. Shamma, A. Aldwayyan, H. Albrithen, A. Alodhayb, AIP Adv., 11 (2021) 025209.
  • Y. Jeon, R. Sood, J.-H. Jeong, S.-G. Kim, Sens. Actuator A Phys., 122 (2005) 16–22.
  • J.S. Pulskamp, R.G. Polcawich, R.Q. Rudy, S.S. Bedair, R.M. Proie, T. Ivanov, G.L. Smith, MRS bulletin, 37 (2012) 1062–1070.
  • H. Pandya, S. Chandra, A. Vyas, Sens. Actuators B: Chem., 161 (2012) 923–928.
  • N. Kilinc, O. Cakmak, A. Kosemen, E. Ermek, S. Ozturk, Y. Yerli, Z.Z. Ozturk, H. Urey, Sens. Actuators B: Chem., 202 (2014) 357–364.
  • S. Han, H. Lee, H. Lee, J. Kim, J. Kim, C. Oh, S. Choa, Current Applied Physics, 6 (2006) e81–e85.
  • A.N. Alodhayb, H.A. Albrithen, K.Z. Shamma, Google Patents2020.
  • V. Ravindrachary, R.F. Bhajantri, S. Praveena, B. Poojary, D. Dutta, P. Pujari, Polym. Degrad. Stab, 95 (2010) 1083–1091.
  • U. Hossain, V. Lima, O. Baake, D. Severin, M. Bender, W. Ensinger, Nucl Instrum Methods Phys Res B . 326 (2014) 135–139.
  • C.P. Ennis, R.I. Kaiser, Physical Chemistry Chemical Physics, 12 (2010) 14902–14915.
  • F. Yasser HA, A. Amr El-Hag, E.-M. Ghada F, R. Reda, MWorld Journal of Condensed Matter Physics, 2011 ( 2011).
  • J. Megusar, Journal of nuclear materials, 245 (1997) 185–190.
  • B. Ahmed, S. Raghuvanshi, A. Srivastava, J. Krishna, M. Wahab, Indian Journal of Pure & Applied Physics, (2012).
  • E. Lee, G. Rao, L. Mansur, Radiat. Phys. Chem., 55 (1999) 293–305.
  • V. Rai, C. Mukherjee, B. Jain, Indian Journal of Pure & Applied Physics, 55 (2017) 775–785.
  • H. Kudo, S. Sudo, T. Oka, Y. Hama, A. Oshima, M. Washio, T. Murakami, Radiat. Phys. Chem., 78 (2009) 1067–1070.
  • V. Rai, Applied optics, 28 (1989) 2450–2451.
  • H. Subrahmanyam, S. Subramanyam, Polymer, 28 (1987) 1331–1333.
  • Y.-S. Lin, S. Lee, B.C. Lin, C.P. Cheng, Mater. Chem. Phys., 78 (2003) 847–851.
  • C. Lin, S. Lee, Journal of applied polymer science, 44 (1992) 2213–2224.
  • S.O. Cho, H.Y. Jun, Nucl Instrum Methods Phys Res B . 237 (2005) 525–532.
  • K.-P. Lu, S. Lee, C.P. Cheng, Int. J. Appl. Phys., 88 (2000) 5022–5027.
  • P. Tiwari, A. Srivastava, B. Khattak, S. Verma, A. Upadhyay, A. Sinha, T. Ganguli, G. Lodha, S. Deb, Measurement, 51 (2014) 1–8.
  • P. Singh, R. Kumar, H. Virk, R. Prasad, Indian Journal of Pure and Applied Physics 48:321–325 (2010).
  • H. Kaouach, F. Hosni, M. Daoudi, A. Bardaoui, K. Farah, H. Hamzaoui, R. Chtourou, Superlattices and Microstructures, 55 (2013) 191–197.
  • H. Chandrappa, R.F. Bhajantri, B. Mahantesha, V. Ravindrachary, S. Chalawadi, Radiat. Phys. Chem., 184 (2021) 109481.
  • K. Chikaoui, Radiat. Phys. Chem., 162 (2019) 18–22.
  • T. Naito, N. Konno, T. Tokunaga, T. Itoh, IEEE Sensors Journal, 13 (2013) 2899–2905.
  • E. Onyiriuka, L. Hersh, W. Hertl, Applied spectroscopy, 44 (1990) 808–811.
  • J.A. Yabagi, M.I. Kimpa, M.N. Muhammad, S.B. Rashid, E. Zaidi, M.A. Agam, IOP Conference Series: Materials Science and Engineering, IOP Publishing2018, pp. 012004.

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