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Journal of Quality Technology
A Quarterly Journal of Methods, Applications and Related Topics
Volume 17, 1985 - Issue 2
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Computer Programs

A Computer Program for the ASN of Curtailed Attributes Sampling Plans

Herbert C. RutemillerCalifornia State University, Fullerton, CA92634View further author information
&
Ray E. SchaferHughes Aircraft Company, Fullerton, CA92634View further author information
Pages 108-113 | Published online: 22 Feb 2018

References

  • Burr, I. W. (1957). “Average Sample Number Under Curtailed or Truncated Inspection”. Industrial Quality Control 13, pp. 5–7.
  • Craig, C. C. (1968). “The Average Sample Number for Truncated Single and Double Attributes Acceptance Sampling Plans”. Technometrics 10, pp. 685–692.
  • MIL-STD-105D (1963). Sampling Procedures and Tables for Inspection by Attributes. Department of Defense, Washington, D.C.
  • Olorunniwo, F. O. and Salas, J. R. (1982). “An Algorithm for Determining Double Attribute Sampling Plans”. Journal of Quality Technology 14, pp. 166–171.
  • Schilling, E. G.; Sheesley, J. H; and Nelson, P. R. (1978). “GRASP: A General Routine for Attribute Sampling Plan Evaluation”. Journal of Quality Technology 10, pp. 125–130.
  • Shah, D. K. and Phatak, A. G. (1974). “The Maximum Likelihood Estimate of the Fraction Defective Under Curtailed Multiple Sampling Plans”. Technometrics 16, pp. 311–315.
  • Statistical Research Group (1948). Sampling Inspection. McGraw-Hill Book Co., New York, NY.
  • Vajda, S. (1946). “Average Sample Numbers from Finite Lots”. Journal of the Royal Statistical Society, Series B 8, pp. 198–201.

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