References
- Burr, I. W. (1957). “Average Sample Number Under Curtailed or Truncated Inspection”. Industrial Quality Control 13, pp. 5–7.
- Craig, C. C. (1968). “The Average Sample Number for Truncated Single and Double Attributes Acceptance Sampling Plans”. Technometrics 10, pp. 685–692.
- MIL-STD-105D (1963). Sampling Procedures and Tables for Inspection by Attributes. Department of Defense, Washington, D.C.
- Olorunniwo, F. O. and Salas, J. R. (1982). “An Algorithm for Determining Double Attribute Sampling Plans”. Journal of Quality Technology 14, pp. 166–171.
- Schilling, E. G.; Sheesley, J. H; and Nelson, P. R. (1978). “GRASP: A General Routine for Attribute Sampling Plan Evaluation”. Journal of Quality Technology 10, pp. 125–130.
- Shah, D. K. and Phatak, A. G. (1974). “The Maximum Likelihood Estimate of the Fraction Defective Under Curtailed Multiple Sampling Plans”. Technometrics 16, pp. 311–315.
- Statistical Research Group (1948). Sampling Inspection. McGraw-Hill Book Co., New York, NY.
- Vajda, S. (1946). “Average Sample Numbers from Finite Lots”. Journal of the Royal Statistical Society, Series B 8, pp. 198–201.