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Journal of Quality Technology

A Quarterly Journal of Methods, Applications and Related Topics

Volume 27, 1995 - Issue 4

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Articles

Using Degradation Data to Improve Fluorescent Lamp Reliability

Sheng-Tsaing TsengNational Tsing-Hua University, Hsinchu, Tawain, 30043View further author information

Michael HamadaBellcore, Morristown, NJ, 07960View further author information

Chih-Hua ChiaoSoochow University, Taipei, Taiwan, 100View further author information

Pages 363-369 | Published online: 21 Feb 2018

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https://doi.org/10.1080/00224065.1995.11979618

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References

Lin W. Z. (1976). Fundamentals of Fluorescent Lamp. Taiwan Fluorescent Lamp Co. Corp., Taiwan.
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Lu, C. J. and Meeker, W. Q. (1993). “Using Degradation Measures to Estimate a Time-to-Failure Distribution”. Technometrics 35, pp. 161–174.
Web of Science ®Google Scholar
Montgomery, D. C. (1991). Design and Analysis of Experiments, 3rd ed., John Wiley & Sons, New York, NY.
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Nelson, W. (1990). Accelerated Testing-Statistical Models, Test Plans, and Data Analysis. John Wiley & Sons, New York, NY.
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Symposia on Taguchi Methods (1984–1993). American Supplier Institute, Romulus, MI.
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