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Journal of Quality Technology
A Quarterly Journal of Methods, Applications and Related Topics
Volume 30, 1998 - Issue 4
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Articles

The Burr XII Distribution in Reliability Analysis

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Pages 386-394 | Published online: 20 Feb 2018

References

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  • Wang, F. K.; Keats, J. B.; and Zimmer, W. J. (1996). “The Maximum Likelihood Estimation of the Burr XII Parameters with Censored and Uncensored Data”. Microelectronics and Reliability 36, pp. 359–362.
  • Wingo, D. R. (1983). “Maximum Likelihood Methods for Fitting the Burr Type XII Distribution to Life Test Data”. Biometrical Journal 25, pp. 77–81.
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