References
- Bingham, C. and Nelson, L. S. (1981). “An Approximation for the Distribution of the von Neumann Ratio”. Technometrics 23, pp. 285–288.
- Nelson, L. S. (1980). “The Mean Square Successive Difference Test”. Journal of Quality Technology 12, pp. 174–175.
- Nelson, L. S. (1984). “The Shewhart Control Chart—Tests for Special Causes”. Journal of Quality Technology 16, pp. 237–239.
- Western Electric (1985). Statistical Quality Control Handbook. AT&T Technologies, Indianapolis, IN 46219.