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Journal of Quality Technology
A Quarterly Journal of Methods, Applications and Related Topics
Volume 33, 2001 - Issue 3
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Articles

Detecting over Rejection in Testing of Integrated Circuits

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Pages 356-364 | Published online: 20 Feb 2018

References

  • Brook, D. and Evans, D. A. (1972). “An Approach to the Probability Distribution of CUSUM Run Length”. Biometrika 5, pp. 539–549.
  • Lucas, J. M. (1989). “Control Schemes for Low Count Levels”. Journal of Quality Technology 21, pp. 199–201.
  • Mood, A. M., Graybill, F. A. and Boes, D. C. (1974). Introduction to the Theory of Statistics. McGraw-Hill, New York, NY.
  • Moustakides, G. V. (1986). “Optimal Stopping Times for Detecting Changes in Distributions”. The Annals of Statistics 14, pp. 1379–1387.
  • Page, E. S. (1955). “Control Charts with Warning Lines”. Biometrika 42, pp. 243–257.
  • Woodall, W. H. and Ncube, M. M. (1985). “Multivariate CUSUM Quality Control Procedure”. Technometrics 27, pp. 285–292.
  • Woodall W. H. and Reynolds, M. R., Jr. (1983). “A Discrete Markov Chain Representation of the Sequential Probability Ratio Test”. Communications in Statistics-Sequential Analysis 2, pp. 27–44.

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