References
- Thomas , J. M. 1969 . Adv. in Catalysis , 19 : 293 Representative review articles of the role of defects and other generalized distortion fields in solid state reactions include;
- Thomas , J. M. , Evans , E. L. and Williams , J. O. 1972 . Proc. R. Soc. Lond. , A331 : 417
- Jones , W. and Thomas , J. 1979 . Prog. Solid St. Chem. , 12 : 101
- Sheen , D. B. and Sherwood , J. N. 1986 . Chem. in Brit. , June : 535
- Jones , W. private communication
- Many techniques fall under the general title of “X‐ray Topography”; They can be usefully divided into two main regimes, (a) those utilizing radiation from conventional sources, or “conventional techniques”, such as the Lang technique (referred to in the text as “Conventional X‐ray Topography” (CXRT), and (b) those utilizing synchrotron radiation sources, or “synchrotron techniques”, such as “Synchrotron White Radiation Topography” (SWRT). General reviews on the various techniques can be found in references 4 and 5
- Tanner , B. K. 1976 . X‐ray Diffraction Topography , Pergamon .
- 1980 . The Characterization of Crystal Growth Defects by X‐ray Methods , NATO‐ASI Series B: Physics Vol. 63 , NY : Plenum .
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- Sandor , R. B. 1988 . Ph. D. thesis Brandeis University .