References
- A. ROBINSON, B. KIEDROWSKI, and D. HENDERSON, “Status on the Development of a Monte Carlo Methods Research Framework,” Trans. Am. Nucl. Soc., 111, 1161 (2014).
- L. J. KERSTING et al., “Status of the Framework for Research in Nuclear Science and Engineering,” Proc. 20th Topl. Mtg. Radiation Protection and Shielding Division, Santa Fe, New Mexico, August 26–31, 2018, American Nuclear Society (2018).
- L. J. KERSTING et al., “Energy Deposition Validation Results for the Evaluate Electron Data Library in FRENSIE,” Proc. 20th Topl. Mtg. Radiation Protection and Shielding Division, Santa Fe, New Mexico, August 26–31, 2018, American Nuclear Society (2018).
- L. J. KERSTING et al., “Validation and Verification of the Evaluated Electron Data Library in FRENSIE,” Nucl. Sci. Eng., 193, 4, 346 (2019); https://doi.org/10.1080/00295639.2018.1525976.
- L. DESORGHER, F. LEI, and G. SANTIN, “Implementation of the Reverse/Adjoint Monte Carlo Method into Geant4,” Nucl. Instrum. Meth. Phys. Res. A, 621, 1–3, 247 (2010); https://doi.org/10.1016/j.nima.2010.06.001.
- R. P. KENSEK et al., “Space Applications of the MITS Electron-Photon Monte Carlo Transport Code System,” IEEE Trans. Nucl. Sci., 43, 6, 2724 (1996); https://doi.org/10.1109/23.556859.
- L. L. CARTER and E. D. CASHWELL, “Particle-Transport Simulation with the Monte Carlo Method,” Los Alamos Scientific Laboratory (1975); http://www.osti.gov/scitech/servlets/purl/4167844.
- D. E. PEPLOW, S. W. MOSHER, and T. M. EVANS, “Consistent Adjoint Driven Importance Sampling Using Space, Energy and Angle,” ORNL/TM-2012/7, Oak Ridge National Laboratory (2012).
- L. J. LORENCE, J. E. MOREL, and G. D. VALDEZ, “Physics Guide to CEPXS: A Multi-Group Coupled Electron-Photon Cross-Section Generating Code,” SAND-89-1685, Sandia National Laboratories (1989).
- T. M. JORDAN, “An Adjoint Charged Particle Transport Method,” IEEE Trans. Nucl. Sci., 23, 6, 1857 (1976); https://doi.org/10.1109/TNS.1976.4328590.
- L. J. LORENCE, R. P. KENSEK, and J. A. HALBLEIB, “Adjoint Electron-Photon Transport Monte Carlo Calculations with ITS,” IEEE Trans. Nucl. Sci., 42, 6, 1895 (1995); https://doi.org/10.1109/23.489232.
- N. BORISOV and M. PANIN, “Generalized Particle Concept for Adjoint Monte Carlo Calculations of Coupled Gamma-Ray-Electron-Positron Transport,” Nucl. Sci. Eng., 150, 3, 284 (2005); https://doi.org/10.13182/NSE05-A2516.
- J. E. HOOGENBOOM, “Methodology of Continuous-Energy Adjoint Monte Carlo for Neutron, Photon, and Coupled Neutron-Photon Transport,” Nucl. Sci. Eng., 143, 99 (2003); https://doi.org/10.13182/NSE03-A2322.
- D. IRVING, “The Adjoint Boltzmann Equation and Its Simulation by Monte Carlo,” Nucl. Eng. Des., 15, 273 (1971); https://doi.org/10.1016/0029-5493(71)90069-0.
- D. GABLER, J. HENNIGER, and U. REICHELT, “AMOS—An Effective Tool for Adjoint Monte Carlo Photon Transport,” Nucl. Instrum. Meth. Phys. Res. B, 251, 2, 326 (2006); https://doi.org/10.1016/j.nimb.2006.07.005.
- R. PIESSENS, Quadpack: A Subroutine Package for Automatic Integration, Springer-Verlag, Berlin (1983).
- G. I. BELL and S. GLASSTONE, Nuclear Reactor Theory, Krieger Publishing Company (1979).
- R. BÖNGELER et al., “Electron-Specimen Interactions in Low-Voltage Scanning Electron Microscopy,” Scanning, 15, 1, 1 (1993); https://doi.org/10.1002/sca.4950150102.
- A. M. D. ASSA’D and M. M. EL GOMATI, “Backscattering Coefficients for Low Energy Electrons,” Scanning Microsc., 12, 1, 185 (1998).
- J. K. BIENLEIN and G. SCHLOSSER, “Rückstreuung von Elektronen im Energiebereich von 60 bis 100 keV,” Z. Phys., 174, 1, 91 (1963); https://doi.org/10.1007/BF01418815.
- H. BISHOP, “Some Electron Backscattering Measurements for Solid Targets,” Proc. 4th Int. Symp. X-Ray Optics and X-Ray Microanalysis, Orsay, France, September 1965, p. 153 (1966).
- I. M. BRONSTEIN and B. S. FRAIMAN, Vtorichnaya Elektronnaya Emissiya (Secondary Electron Emission), p. 340, Nauka, Moscow (1969).
- V. COSSLETT and R. THOMAS, “Multiple Scattering of 5-30 keV Electrons in Evaporated Metal Films III: Backscattering and Absorption,” Br. J. Appl. Phys., 16, 6, 779 (1965); https://doi.org/10.1088/0508-3443/16/6/303.
- H. DRESCHER, L. REIMER, and H. SEIDEL, “Backscattering and Secondary Electron Emission of 10-100 keV Electrons in Scanning Electron Microscopy,” Z. Angew. Phys., 29, 6, 331 (1970).
- M. M. EL GOMATI et al., “Theory Experiment Comparison of the Electron Backscattering Factor from Solids at Low Electron Energy (250-5,000 eV),” Scanning, 30, 1, 2 (2008); https://doi.org/10.1002/sca.20091.
- K. F. J. HEINRICH, “Electron Probe Microanalysis by Specimen Current Measurement,” Proc. 4th Int. Symp. X-Ray Optics and X-Ray Microanalysis, Orsay, France, September 1965.
- H. KANTER, “Energy Dissipation and Secondary Electron Emission in Solids,” Phys. Rev., 121, 677 (1961); https://doi.org/10.1103/PhysRev.121.677.
- H. KULENKAMPFF and K. RÜTTIGER, “Energie- und Winkelverteilung rückdiffundierter Elektronen,” Z. Phys., 137, 4, 426 (1954); https://doi.org/10.1007/BF01333458.
- G. J. LOCKWOOD, G. H. MILLER, and J. A. HALBLEIB, “Simultaneous Integral Measurement of Electron Energy and Charge Albedos,” IEEE Trans. Nucl. Sci., 22, 6, 2537 (1975); https://doi.org/10.1109/TNS.1975.4328164.
- G. NEUBERT and S. ROGASCHEWSKI, “Backscattering Coefficient Measurements of 15 to 60 keV Electrons for Solids at Various Angles of Incidence,” Physica Status Solidi (A), 59, 1, 35 (1980); https://doi.org/10.1002/pssa.2210590104.
- L. REIMER and C. TOLLKAMP, “Measuring the Backscattering Coefficient and Secondary Electron Yield Inside a Scanning Electron Microscope,” Scanning, 3, 35 (1980); https://doi.org/10.1002/sca.4950030105.
- R. SHIMIZU, “Secondary Electron Yield with Primary Electron Beam of Kilo-Electron-Volts,” J. Appl. Phys., 45, 5, 2107 (1974); https://doi.org/10.1063/1.1663552.
- G. SOUM et al., “Etude de la Transmission et de la rétrodiffusion d’électrons d’énergie 0,05 à 3 MeV dans le domaine de la Diffusion Multiple,” Rev. Phys. Appliquee., 22, 10, 1189 (1987); https://doi.org/10.1051/rphysap:0198700220100118900.
- J. G. TRUMP and R. J. van de GRAAFF, “The Secondary Emission of Electrons by High Energy Electrons,” Phys. Rev., 75, 44 (1949); https://doi.org/10.1103/PhysRev.75.44.
- D. B. WITTRY, “Secondary Electron Emission in the Electron Probe,” Proc. 4th Int. Symp. X-Ray Optics and X-Ray Microanalysis, Orsay, France, September 1965.
- D. C. JOY, “A Database on Electron-Solid Interactions,” Scanning, 17, 5, 270 (2006); https://doi.org/10.1002/sca.4950170501.
- T. TABATA, R. ITO, and S. OKABE, “An Empirical Equation for the Backscattering Coefficient of Electrons,” Nucl. Instrum. Meth., 94, 3, 509 (1971); https://doi.org/10.1016/0029-554X(71)90013-9.
- R. ITO, P. ANDREO, and T. TABATA, “Reflection of Electrons and Photons from Solids Bombarded by 0.1-to 100-MeV Electrons,” Radiat. Phys. Chem., 42, 4, 761 (1993); https://doi.org/10.1016/0969-806X(93)90368-5.
- A. POŠKUS, “Evaluation of Computational Models and Cross Sections Used by MCNP6 for Simulation of Electron Backscattering,” Nucl. Instrum. Meth. Phys. Res. B, 368, 15 (2016); https://doi.org/10.1016/j.nimb.2015.11.027.
- J. CAZAUX, “Electron Back-Scattering Coefficient Below 5 keV: Analytical Expressions and Surface-Barrier Effects,” J. Appl. Phys., 112, 8, 084905 (2012); https://doi.org/10.1063/1.4759367.