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Technometrics Volume 21, 1979 - Issue 1
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Original Articles

Confidence Limits on MTBF for Sequential Test Plans of MIL-STD 781

Clifford M. Bryant Knolls Atomic Power Laboratory General Electric Company, Schenectady, NY, 12308
&
Josef Schmee Institute of Administration and Management Union College, Schenectady, NY, 12308
Pages 33-42 | Published online: 09 Apr 2012

REFERENCES

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  • Aroian , L. A. 1976 . Application of the direct method in sequential analysis . Technometrics , 18 : 301 – 306 .
  • Aroian , L. A. and ÖKsoy , D. Estimation, confidence intervals, and incentive plans for sequential three-wav decision procedures . 1972 NATO Conference Proceedings on Reliability Testing and Evaluation . pp. VI-D-1 – VI-D-13 .
  • Epstein , B. 1960 . Estimation from life test data . Technometrics , 2 : 447 – 454 .
  • Epstein , B. , Patterson , A. A. and Qualls , C. R. The exact analysis of sequential life tests with particular application to AGREE plans . Joint AIAA-SEA-ASME Aerospace Reliability and Maintainability Conference . May 1963 .
  • Epstein , B. and Sobel , M. 1955 . Sequential life tests in the exponential case . Ann. Math. Stat. , 26 : 82 – 93 .
  • Goss , T. I. 1974 . Truncated sequential test for a three-way decision procedure for testing the mean of a normal distribution with known variance, and new sequential applications to maintainability demonstration , Ph.D. thesis Schenectady , NY : Union College .
  • Harter , H. L. 1964 . New tables of the incomplete gamma function ratio and of percentage points of the chisquare and beta distribution , Washington , D.C. : U.S. Government Printing Office .
  • Harter , H. L. and Moore , A. H. 1976 . An evaluation of exponential and Weibull test plans . IEEE Transactions on Reliability , R-25 : 100 – 104 .
  • Luetjen , P. 1974 . Tables of parametric confidence limits from hypothesis test data , Hyattsville , Maryland : Naval Ship Engineering Center . NAVSEC Report 6112–75-1
  • Mann , N. R. , Schafer , R. E. and Singpurwalla , N. D. 1974 . Methods for Statistical Analysis of Reliability and Life Data. , New York : John Wiley & Sons, Inc .
  • MIL-STD 781C . 1977 . Military Standard Reliability Qualification on Production Acceptance Tests: Exponential Distribution Washington , D.C.
  • Mood , A. M. , Graybill , F. A. and Boes , D. C. 1974 . Introduction to the Theory of Statistics., , 3rd ed. , New York : McGraw-Hill .
  • Neathammer , R. D. , Pabst , W. R. and Wigginton , C. G. 1965 . MIL-STD 781B, reliability tests: exponential distribution . J. Quality Technology , 1 : 58 – 67 .
  • Schmee , J. 1974 . An exact solution of the sequential t-test and a method for sequential estimation , Ph.D. thesis Schenectady , NY : Union College .
  • Sumerlin , W. T. Confidence calculations for MIL-STD 781 . 1972 Annual Reliability and Maintainability Symposium. pp. 205 – 212 . IEEE Catalog Number 72CH0577–B
  • Wald , A. 1947 . Sequential Analysis. , New York : John Wiley & Sons, Inc .

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