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Technometrics Volume 35, 1993 - Issue 2

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Discussion

Trevor Hastie Statistics and Data Analysis Research Department, AT&T Bell Laboratories, Murray Hill, NJ, 07974

Cohn Mallows Statistics and Data Analysis Research Department, AT&T Bell Laboratories, Murray Hill, NJ, 07974

Pages 140-143 | Published online: 12 Mar 2012

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https://doi.org/10.1080/00401706.1993.10485035

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ADDITIONAL REFERENCES

Hastie , T. , Buja , A. and Tibshirani , R. 1992 . “Penalized Discriminant Analysis,” unpublished manuscript
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Krukar , R. , Kornblit , A. , Clark , L. , Kruskal , J. , Lambert , D. , Reitman , E. and Gottscho , R. 1992 . “Reactive Ion Etching Profile and Depth Characterization Using Statistical and Neural Analysis of Light Scattering Data,” unpublished manuscript
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Wahba , G. 1990 . Spline Models for Observational Data Philadelphia : Society for Industrial and Applied Mathematics. .
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