Comparison of convergent-beam electron diffraction methods for determination of foil thickness

J. Glazer Department of Materials Science and Mineral Engineering, University of California, Berkeley, California, 94720, U.S.A.

R. Ramesh Department of Materials Science and Mineral Engineering, University of California, Berkeley, California, 94720, U.S.A.

M. R. Hilton Department of Materials Science and Mineral Engineering, University of California, Berkeley, California, 94720, U.S.A.

M. Sarikaya Department of Materials Science and Mineral Engineering, University of California, Berkeley, California, 94720, U.S.A.; University of Washington, Seattle, Washington, 98195, U.S.A.

References

Ackermani , N. 1948 . Ann. Phys. , 6 : 19
Google Scholar
Allen , S. M. 1981 . Phil. Mag. A , 41 : 325
Google Scholar
Allen , S. M. and Hall , E. L. 1982 . Phil. Mag. A , 46 : 243
Google Scholar
Blake , R. G. , Jostons , A. , Kelly , P. M. and Napier , J. G. 1978 . Phil. Mag. A , 37 : 1
Google Scholar
Castro-Fernandez , F. R. , Sellars , C. M. and Whiteman , J. A. 1985 . Phil. Mag. A , 52 : 289
Google Scholar
Kelly , P. M. , Jostons , A. , Blake , R. G. and Napier , J. G. 1975 . Phys. Stat. Sol. (a) , 31 : 771
Web of Science ®Google Scholar
MacGillavry , C. H. 1940 . Physica , 7 : 329
Google Scholar

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