The study of misfit dislocations in In_xGa₁-_xAs/GaAs strained quantum well structures

References

• Adams , A. R. and Dunstan , D. J. 1990 . Semicond. Sci. Technol. , 5 : 1194
   Google Scholar
• Allen Vawter , G. and Myers , D. R. 1989 . J. appl. Phys. , 65 : 4769
   Google Scholar
• Anderson , N. G. , Laidig , W. D. , Kolbas , R. M. and Lo , Y. C. 1986 . J. appl. Phys. , 60 : 2361
   Google Scholar
• Anderson , T. G. , Chen , Z. G. , Kulakovskii , V. D. , Uddin , A. and Vallin , J. T. 1987 . Appl. Phys. Lett. , 51 : 752
   Google Scholar
• Bird , D. M. and Preston , A. R. Institute of Physics Conference Series No. 98 . Proceedings of the Electron Microscopy and Analysis Group, 1989 . pp. 123 Bristol : Institute of Physics .
   Google Scholar
• Carpenter , R. W. and Spence , J. C. H. 1982 . Acta crystallogr. A , 38 : 55
   Google Scholar
• Cherns , D. and Preston , A. R. 1989 . J. Electron Microsc. Techniques , 13 : 111
   PubMedGoogle Scholar
• Day , J. C. C. 1988 . Physics Department, University of Bristol . Ph.D. Thesis
   Google Scholar
• Dixon , R. H. and Goodhew , P. J. 1990 . J. appl. Phys. , 68 : 3163
   Web of Science ®Google Scholar
• Fitzgerald , E. A. , Ast , D. G. , Ashizawa , Y. , Akbar , S. and Eastman , L. F. 1988 . J. appl. Phys. , 64 : 2473
   Web of Science ®Google Scholar
• Fritz , I. J. 1987 . Appl. Phys. Lett. , 51 : 1080
   Web of Science ®Google Scholar
• Fung , K. K. 1985 . Ultramicroscopy , 17 : 81
   Web of Science ®Google Scholar
• Goeth , K. H. , Bimberg , D. , Jürgensen , H. , Selders , J. , Solomonov , A. V. , Glinski , G. F. and Razeghi , M. 1983 . J. appl. Phys. , 54 : 4543
   Google Scholar
• Gourley , P. L. , Fritz , I. J. and Dawson , L. R. 1988 . Appl. Phys. Lett. , 52 : 377
   Web of Science ®Google Scholar
• Green , G. S. , Tanner , B. K. , Barnett , S. J. , Emeny , M. , Pitt , A. D. , Whitehouse , C. R. and Clark , G. F. 1990 . Phil. Mag. Lett. , 62 : 131
   Web of Science ®Google Scholar
• Herbeaux , C. , Persio , Di J. and Lefebvre , A. 1989a . Appl. Phys. Lett. , 54 : 1004
   Web of Science ®Google Scholar
• 1989b . Phil. Mag. Lett. , 59 : 243
   Web of Science ®Google Scholar
• Lefebvre , A. , Herbeaux , C. , Bouillet , C. and Persio , Di J. 1991 . Phil. Mag. Lett. , 63 : 23
   Web of Science ®Google Scholar
• Maihiot , C. and Smith , D. L. 1990 . Crit. Rev. Solid St. Mater. Sci. , 16 : 131
   Google Scholar
• Myhajlenko , S. , Batstone , J. L. , Hutchinson , H. T. and Steeds , J. W. 1984 . J. Phys. C , 17 : 6477
   Web of Science ®Google Scholar
• Osbourn , G. C. , Gourley , P. L. , Fritz , I. J. , Biefeld , R. M. , Dawson , L. R. and Zipperian , T. E. 1987 . Semicond. Semimetals , 24 : 459
   Google Scholar
• Rajan , K. , Devine , R. , Moore , W. T. and Maigne , P. 1987 . J. appl. Phys. , 62 : 1713
   Web of Science ®Google Scholar
• Roberts , S. 1981 . “ 1981, Institute of Physics Conference Series No. 60 ” . In Microscopy of Semiconducting Materials , 377 Bristol : Institute of Physics .
   Google Scholar
• Spellward , P. 1990 . Physics Department, University of Bristol . Ph.D. Thesis
   Google Scholar
• Tanaka , M. , Saito , R. , Ueno , K. and Harada , Y. 1989 . J. Electron Microsc. , 29 : 408
   Google Scholar
• Westwood , D. I. , Woolf , D. A. and Williams , R. H. 1989 . J. Cryst. Growth , 98 : 782
   Google Scholar