Quantifying dielectric permittivity based on the electrowetting effects on the adhesion force behavior using scanning probe microscopy

References

• Kumar B, Bonvallet JC, Crittenden SR. Dielectric constants by multifrequency non-contact atomic force microscopy. Nanotechnology. 2012;23:025707(6 pp).
   Google Scholar
• Lu W, Wang D, Chen L. Near-static dielectric polarization of individual carbon nanotubes. Nano Lett. 2007;7:2729–2733.10.1021/nl071208m
   PubMed Web of Science ®Google Scholar
• Crider PS, Majewski MR, Zhang J, et al. Local dielectric spectroscopy of polymer films. Appl. Phys. Lett. 2007;91:013102–013102-3.
   Google Scholar
• Crider PS, Majewski MR, Zhang J, et al. Local dielectric spectroscopy of near-surface glassy polymer dynamics. J. Chem. Phys. 2008;128:044908–044908-5.
   Google Scholar
• Fumagalli L, Ferrari G, Sampietro M, et al. Dielectric-constant measurement of thin insulating films at low frequency by nanoscale capacitance microscopy. Appl. Phys. Lett. 2007;91:243110–243110-3.
   Web of Science ®Google Scholar
• Gramse G, Casuso I, Toset J, et al. Quantitative dielectric constant measurement of thin films by DC electrostatic force microscopy. Nanotechnology. 2009;20:395702(8 pp).
   PubMed Web of Science ®Google Scholar
• Fumagalli L, Ferrari G, Sampietro M, et al. Quantitative nanoscale dielectric microscopy of single-layer supported biomembranes. Nano Lett. 2009;9:1604–1608.10.1021/nl803851u
   PubMed Web of Science ®Google Scholar
• Fumagalli L, Gramse G, Esteban-Ferrer D, et al. Quantifying the dielectric constant of thick insulators using electrostatic force microscopy. Appl. Phys. Lett. 2010;96:183107–183107-3.
   Web of Science ®Google Scholar
• Gramse G, Gomila G, Fumagalli L. Quantifying the dielectric constant of thick insulators by electrostatic force microscopy: effects of the microscopic parts of the probe. Nanotechnology. 2012;23:205703(7 pp).
   PubMed Web of Science ®Google Scholar
• Riedel C, Arinero R, Tordjeman P, et al. Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy. J. Appl. Phys. 2009;106:024315–024315-6.
   Google Scholar
• Riedel C, Arinero R, Tordjeman P, et al. Nanodielectric mapping of a model Polystyrene-Poly(Vinyl Acetate) blend by electrostatic force microscopy. Phys. Rev. E. 2010;81:010801–010801-4.
   Web of Science ®Google Scholar
• Revilla RI, Li XJ, Yang YL, et al. Comparative method to quantify dielectric constant at nanoscale using atomic force microscopy. J. Phys. Chem. C. 2014;118:5556–5562.10.1021/jp411951h
   Web of Science ®Google Scholar
• Wheeler AR. Putting electrowetting to work. Science. 2008;322:539–540.10.1126/science.1165719
   PubMed Web of Science ®Google Scholar
• Shamai R, Andelman D, Berge B, et al. Water, electricity, and between … On electrowetting and its applications. Soft Matter. 2008;4:38–45.10.1039/B714994H
   Web of Science ®Google Scholar
• Mugele F, Baret JC. Electrowetting: from basics to applications. J. Phys.: Condens. Matter. 2005;17:R705–R774.
   Web of Science ®Google Scholar
• Quinn A, Sedev R, Ralston J. Contact angle saturation in electrowetting. J. Phys. Chem. B. 2005;109:6268–6275.10.1021/jp040478f
   PubMed Web of Science ®Google Scholar
• Chevalliot S, Kuiper S, Heikenfeld J. Experimental validation of the invariance of electrowetting contact angle saturation. J. Adhes. Sci. Technol. 2012;26:1909–1930.
   Web of Science ®Google Scholar
• Crane NB, Mishra P, Volinsky AA. Characterization of electrowetting processes through force measurements. Rev. Sci. Instrum. 2010;81:043902(7 pp).
   Web of Science ®Google Scholar
• Guan L, Qi GC, Liu S, et al. Nanoscale electrowetting effects studied by atomic force microscopy. J. Phys. Chem. C. 2009;113:661–665.10.1021/jp806538r
   Web of Science ®Google Scholar
• Revilla RI, Guan L, Zhu XY, et al. Nanoscale electrowetting effects observed by using friction force microscopy. Langmuir. 2011;27:7603–7608.10.1021/la200983y
   PubMed Web of Science ®Google Scholar
• Revilla RI, Guan L, Zhu XY, et al. Electrowetting phenomenon on nanostructured surfaces studied by using atomic force microscopy. J. Phys. Chem. C. 2012;116:14311–14317.10.1021/jp301549p
   Web of Science ®Google Scholar
• Israelachvili JN. Adhesion forces between surfaces in liquids and condensable vapours. Surf. Sci. Rep. 1992;14:109–159.10.1016/0167-5729(92)90015-4
   Web of Science ®Google Scholar
• Israelachvili JN. Adhesion in intermolecular and surface forces. 2nd ed. London: Academic Press; 1992.
   Google Scholar
• Pallas NR, Harrison Y. An automated drop shape apparatus and the surface tension of pure water. Colloids Surf. 1990;43:169–194.10.1016/0166-6622(90)80287-E
   Google Scholar
• Papathanasiou AG, Papaioannou AT, Boudouvis AG. Illuminating the connection between contact angle saturation and dielectric breakdown in electrowetting through leakage current measurements. J. Appl. Phys. 2008;103:034901(4 pp).
   Google Scholar
• Gray PR, Hurst PJ, Lewis SH, et al. Analysis and design of analog integrated circuits. 5th ed. New York (NY): Wiley; 2009.
   Google Scholar
• Hsu SL. Polymer data handbook: poly(methyl methacrylate). 2nd ed. New York (NY): Oxford University Press; 2009.
   Google Scholar
• Farshchi-Tabrizi M, Kappl M, Cheng Y, et al. On the adhesion between fine particles and nanocontacts: an atomic force microscope study. Langmuir. 2006;22:2171–2184.10.1021/la052760z
   PubMed Web of Science ®Google Scholar