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Short paper

The high‐speed measurement of a partial area imaging system applied to photoresist development processing

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Pages 721-726 | Received 21 Apr 2004, Accepted 23 Sep 2004, Published online: 04 Mar 2011

Reference

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  • Lin , G. R. 1999 . “Dynamical Mapping and End‐Point Detection of Photoresist Development by Using Plastic‐Fiber‐Bundle Probe Array,” . IEEE Transactions on Instrumentation and Measurement , 48 ( 6 ) : 1319 – 1323 .
  • Morton , S. L. , Degertekin , F. L. and Khuri‐Yakub , B. T. 1999 . “Ultrasonic Sensor for Photoresist Process Monitoring,” . IEEE Transactions on Semiconductor Manufacturing , 12 ( 3 ) : 332 – 339 .
  • Corresponding author. (Tel: 886–4–24517250 ext. 3929; Fax: 886–4–24519951; Email: [email protected])

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