182
Views
3
CrossRef citations to date
0
Altmetric
Original Articles

Designing a Degradation Test with a Two-Parameter Exponential Lifetime Distribution

&
Pages 1938-1958 | Received 11 Dec 2012, Accepted 11 Jun 2013, Published online: 14 Apr 2014

References

  • Bae , S. J. , Kim , S. J. , Kim , M. S. , Lee , B. J. and Kang , C. W. 2008 . Degradation analysis of nano-contamination in plasma display panels . IEEE Transactions on Reliability , 57 : 222 – 229 .
  • Bae , S. J. and Kvam , P. H. 2004 . A nonlinear random-coefficients model for degradation testing . Technometrics , 46 : 460 – 469 .
  • Bae , S. J. and Kvam , P. H. 2006 . A change-point analysis for modeling incomplete burn-in for light display . IIE Transactions , 38 : 489 – 498 .
  • Bagdonavicius , V. and Nikulin , M. 2002 . Accelerated Life Models: Modeling and Statistical Analysis , New York : Chapman & Hall/CRC .
  • Balka , J. , Desmond , A. E. and McNicholas , P. D. 2009 . Review and implementation of cure models based on first hitting times for Wiener process . Lifetime Data Analysis , 15 : 147 – 176 .
  • Berman , M. 1981 . Inhomogeneous and modulated gamma processes . Biometrika , 68 : 143 – 152 .
  • Chen , Z. and Zheng , S. 2005 . Lifetime distribution based degradation analysis . IEEE Transaction on Reliability , 54 : 3 – 10 .
  • Cheng , Y. S. and Peng , C. Y. 2012 . Integrated degradation models in R using iDEMO . Journal of Statistical Software , 49 ( 2 ) : 1 – 22 .
  • Chhikara , R. S. and Folks , L. 1980 . The Inverse Gaussian Distribution: Theory, Methodology, and Applications , New York : Marcel Dekker .
  • Chou , Y. M. and Owen , D. B. 1989 . Simultaneous one-sided prediction intervals for a two-parameter exponential distribution using complete or type II censored data . Metrika , 36 : 279 – 290 .
  • Crowder , M. and Lawless , J. E. 2007 . On a scheme for predictive maintenance . European Journal of Operational Research , 16 : 1713 – 1722 .
  • Crowder , M. J. , Kimber , A. C. , Smith , R. L. and Sweeting , T. J. 2000 . Statistical Analysis of Reliability Data , Baca Raton : Chapman & Hall/CRC .
  • Doksum , K. A. and Hóyland , A. 1992 . Models for variable-stress accelerated life testing experiments based on Wiener processes and the inverse Gaussian distribution . Technometrics , 34 : 74 – 82 .
  • Doksum , K. A. and Normand , S. L. T. 1995 . Gaussian models for degradation processes-Part I: Methods for the analysis of biomarker data . Lifetime Data Analysis , 1 : 135 – 144 .
  • Elsayed , E. A. 2012 . Overview of reliability testing . IEEE Transactions on Reliability , 61 : 282 – 291 .
  • Johnson , N. L. , Kotz , S. and Balakrishnan , N. 1995 . Continuous Univariate Distributions. Vol. 1, , 2nd ed , New York : John Wiley & Sons .
  • Lawless , J. E. and Crowder , M. 2004 . Covariates and random effects in a gamma process model with application to degradation and failure . Lifetime Data Analysis , 10 : 213 – 227 .
  • Lawless , J. F. 2003 . Statistical Models and Methods for Lifetime Data. , 2nd ed , New York : John Wiley & Sons .
  • Horrocks , J. and Thompson , M. E. 2004 . Modeling event times with multiple outcomes using the Wiener process with drift . Lifetime Data Analysis , 10 : 29 – 49 .
  • Ishwaran , I. and James , L. E. 2004 . Computational methods for multiplicative intensity models using weighted gamma processes: Proportional hazards, marked point processes, and panel count data . Journal of the American Statistical Association , 99 : 175 – 190 .
  • Lee , M. L. T. and Whitmore , G. A. 1993 . Stochastic processes directed by randomized time . Journal of Applied Probability , 30 : 302 – 314 .
  • Lindstrom , M. J. and Bates , D. M. 1990 . Nonlinear mixed effect models for repeated measures data . Biometrics , 46 : 673 – 687 .
  • Lu , C. J. and Meeker , W. Q. 1993 . Using degradation measures to estimate a time-to-failure distribution . Technometrics , 35 : 161 – 174 .
  • Meeker , W. Q. and Escobar , L. A. 1998 . Statistical Methods for Reliability Data , New York : John Wiley & Sons .
  • Nelson , W. 1990 . Accelerated Testing: Statistical Models, Test Plans, and Data Analysis , New York : John Wiley & Sons .
  • Nelson , W. 2005 . A bibliography of accelerated test plans: Part II-references . IEEE Transactions on Reliability , 54 : 370 – 373 .
  • Noortwijk , J. M. V. 2009 . A survey of the application of gamma processes in maintenance . Reliability Engineering & System Safety , 94 : 2 – 21 .
  • Park , C. and Padgett , W. J. 2005 . Accelerated degradation models for failure based on geometric Brownian motion and gamma processes . Lifetime Data Analysis , 11 : 511 – 527 .
  • Peng , C. Y. and Tseng , S. T. 2009 . Mis-specification analysis of linear degradation models . IEEE Transactions on Reliability , 58 : 444 – 455 .
  • Peng , C. Y. and Tseng , S. T. 2010 . Progressive-stress accelerated degradation test for highly-reliable products . IEEE Transactions on Reliability , 59 : 30 – 37 .
  • Pinelis , I. 2002 . L’Hospital type rules for monotonicity with applications . Journal of Inequalities in Pure and Applied Mathematics , 3 ( 1 ) Article 5
  • Roy , A. and Mathew , T. 2005 . A generalized confidence limit for the reliability function of a two-parameter exponential distribution . Journal of Statistical Planning and Inference , 128 : 509 – 517 .
  • Seshadri , V. 1999 . Inverse Gaussian Distributions: Statistical Theory and Applications , New York : Springer-Verlag .
  • Singpurwalla , N. D. 1995 . Survival in dynamic environments . Statistical Science , 10 : 86 – 103 .
  • Tang , L. C. , Goh , T. N. , Sun , Y. S. and Ong , H. L. 1999 . Planning accelerated life tests for censored two-parameter exponential distributions . Naval Research Logistics , 46 : 169 – 186 .
  • Tsai , T. R. , Lin , C. W. , Sung , Y. L. , Chou , P. T. , Chen , C. L. and Lio , Y. L. 2012 . Inference from lumen degradation data under Wiener diffusion process . IEEE Transactions on Reliability , 61 : 710 – 718 .
  • Tseng , S. T. , Hamada , M. and Chiao , C. H. 1995 . Using degradation data to improve fluorescent lamp reliability . Journal of Quality Technology , 27 : 363 – 369 .
  • Tseng , S. T. and Peng , C. Y. 2007 . Stochastic diffusion modeling of degradation data . Journal of Data Science , 5 : 315 – 333 .
  • Wang , X. 2008 . A pseudo-likelihood estimation method for nonhomogeneous gamma process model with random effects . Statistica Sinica , 18 : 1153 – 1163 .
  • Whitmore , G. A. 1995 . Estimating degradation by a Wiener diffusion process subject to measurement error . Lifetime Data Analysis , 1 : 307 – 319 .
  • Wu , S. F. 2010 . Interval estimation for the two-parameter exponential distribution under progressive censoring . Quality and Quantity , 44 : 181 – 189 .
  • Wu , S. J. and Chang , C. T. 2002 . Optimal design of degradation tests in presence of cost constraint . Reliability Engineering & System Safety , 76 : 109 – 115 .
  • Yang , G. 2007 . Life Cycle Reliability Engineering , New York : John Wiley & Sons .
  • Yu , H. F. 2003 . Optimal classification of highly-reliable products whose degradation paths satisfy Wiener processes . Engineering Optimization , 35 : 313 – 324 .
  • Yu , H. F. and Tseng , S. T. 1999 . Designing a degradation experiment . Naval Research Logistics , 46 : 689 – 706 .
  • Yu , H. F. and Tseng , S. T. 2002 . Designing a screening degradation experiment . Naval Research Logistics , 49 : 514 – 526 .
  • Yu , H. F. and Tseng , S. T. 2004 . Designing a degradation experiment with a reciprocal Weibull degradation rate . Quality Technology and Quantitative Management , 1 : 47 – 63 .

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.