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Research Article

Designing acceptance sampling plans for polynomial profiles using EWMA statistics based on process yield index

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Received 29 Aug 2022, Accepted 12 Jun 2024, Published online: 08 Jul 2024

References

  • Alidousti, Z. 2019. Developing acceptance sampling plans for multivariate profile Quality characteristic. Master thesis, Industrial Engineering Department, Shahed university, Tehran, Iran.
  • Aslam, M., and F. K. Wang. 2017. Acceptance sampling plans for linear profiles with one-sided specifications. Journal of Statistical Computation and Simulation 87(4):806–16. doi: 10.1080/00949655.2016.1226311.
  • Azam, M., O. H. Arif, M. Aslam, and W. Ejaz. 2016. Repetitive acceptance sampling plan based on exponentially weighted moving average regression estimator. Journal of Computational and Theoretical Nanoscience 13(7):4413–26. doi: 10.1166/jctn.2016.5300.
  • Banihashemi, A., M. S. Fallah Nezhad, and A. Amiri. 2023. Developing process-yield-based acceptance sampling plans for AR (1) auto-correlated process. Communications in Statistics-Simulation and Computation 52(9):4230–51. doi: 10.1080/03610918.2021.1958845.
  • Banihashemi, A., M. S. F. Nezhad, and A. Amiri. 2021. A new approach in the economic design of acceptance sampling plans based on process yield index and Taguchi loss function. Computers & Industrial Engineering 159:107155. doi: 10.1016/j.cie.2021.107155.
  • Boyles, R. A. 1994. Process capability with asymmetric tolerances. Communications in Statistics-Simulation and Computation 23(3):615–35. doi: 10.1080/03610919408813190.
  • Butt, K. A., M. Aslam, and C. H. Jun. 2020. Analysis of process yield in a cost-effective double acceptance sampling plan. Communications in Statistics-Theory and Methods 49(24):5975–87.
  • Govindaraju, K., and S. Ganesalingam. 1997. Sampling inspection for resubmitted lots. Communications in Statistics-Simulation and Computation 26(3):1163–76. doi: 10.1080/03610919708813433.
  • Kalyani, K., G. Srinivasa Rao, K. Rosaiah, and D. C. U. Sivakumar. 2021. Repetitive acceptance sampling plan for odds exponential log-logistic distribution based on truncated life test. Journal of Industrial and Production Engineering 38(5):395–400. doi: 10.1080/21681015.2021.1931492.
  • Kang, L., and S. L. Albin. 2000. On-line monitoring when the process yields a linear profile. Journal of quality Technology 32(4):418–26. doi: 10.1080/00224065.2000.11980027.
  • Khan, N., M. Aslam, C. H. Jun, and J. Hussain. 2018. Design of acceptance sampling plan using a modified EWMA statistic. Communications in Statistics-Theory and Methods 47(12):2881–91. doi: 10.1080/03610926.2017.1343846.
  • Lee, J. C., Hung, H. N., Pearn, W. L., & Kueng, T. L. 2022. On the distribution of the estimated process yield index Spk. Quality and Reliability Engineering International, 18(2), 111–6.
  • Negash, Y. T. 2018. Process yield index and variable sampling plans for autocorrelation between nonlinear profiles. IEEE Access 7:8931–43. doi: 10.1109/ACCESS.2018.2889909.
  • Nezhad, F., and M. Nesaee. 2021. Development of a new variable repetitive group sampling plan based on EWMA yield index. Scientia Iranica 28(4):2457-76.
  • Noor-ul-Amin, M., A. Safeer, and P. Sharma. 2022. Variable acceptance sampling plan based on hybrid exponentially weighted moving averages. Communications in Statistics-Simulation and Computation 51(12):7544–53.
  • Pearn, W. L., and S. Kotz. 2006. Encyclopedia and handbook of process capability indices: a comprehensive exposition of quality control measures. Vol. 12. World Scientific.
  • Schilling, E. G., and D. V. Neubauer. 2009. Acceptance sampling in quality control. Chapman and Hall/CRC.
  • Sherman, R. E. 1965. Design and evaluation of a repetitive group sampling plan. Technometrics 7(1):11–21. doi: 10.1080/00401706.1965.10490222.
  • Tamirat, Y., and F. K. Wang. 2016. Sampling plan based on the exponentially weighted moving average yield index for autocorrelation within linear profiles. Quality and Reliability Engineering International 32(5):1757–68. doi: 10.1002/qre.1911.
  • Tamirat, Y., and F. K. Wang. 2019. Acceptance sampling plans based on EWMA yield index for the first order autoregressive process. Journal of the Operational Research Society 70(7):1179–92. doi: 10.1080/01605682.2018.1487819.
  • Usha, M., and S. Balamurali. 2022. Economic design of quick switching sampling system for resubmitted lots under Gamma-Poisson distribution. American Journal of Mathematical and Management Sciences 41(1):24–37. doi: 10.1080/01966324.2021.1903369.
  • Wang, F. K. 2014. A process yield for simple linear profiles. Quality Engineering 26(3):311–18. doi: 10.1080/08982112.2013.830739.
  • Wang, F. K. 2016. A single sampling plan based on exponentially weighted moving average model for linear profiles. Quality and Reliability Engineering International 32(5):1795–1805. doi: 10.1002/qre.1914.
  • Wang, F. K., C. Y. Huang, and Y. Tamirat. 2017. Implementing EWMA yield index for simple linear profiles with one‐sided specifications in product acceptance determination. Quality and Reliability Engineering International 33(2):401–12. doi: 10.1002/qre.2016.
  • Wang, F. K., and S. C. Lo. 2016. Single mixed sampling plan based on yield index for linear profiles. Quality and Reliability Engineering International 32(4):1535–43. doi: 10.1002/qre.1892.
  • Wang, F. K., and Y. Tamirat. 2016. Two new independent mixed sampling plans for inspecting a product with linear profiles. Quality and Reliability Engineering International 32(8):2999–3009. doi: 10.1002/qre.1984.
  • Wang, F. K., and Y. Tamirat. 2018. Acceptance sampling plan based on an exponentially weighted moving average statistic with the yield index for autocorrelation between polynomial profiles. Communications in Statistics-Theory and Methods 47(19):4859–71. doi: 10.1080/03610926.2018.1454960.
  • Wang, F. K., Y. Tamirat, S. C. Lo, and M. Aslam. 2017. Dependent mixed and mixed repetitive sampling plans for linear profiles. Quality and Reliability Engineering International 33(8):1669–83. doi: 10.1002/qre.2134.
  • Yen, C. H., M. Aslam, and C. H. Jun. 2014. A lot inspection sampling plan based on EWMA yield index. The International Journal of Advanced Manufacturing Technology 75(5–8):861–68. doi: 10.1007/s00170-014-6174-z.
  • Zou, C., F. Tsung, and Z. Wang. 2007. Monitoring general linear profiles using multivariate exponentially weighted moving average schemes. Technometrics 49(4):395–408. doi: 10.1198/004017007000000164.

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